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Morawiec, A. (2007) An algorithm for refinement of lattice parameters using CBED patterns. Ultramicroscopy, 107 (4). 390-395 doi:10.1016/j.ultramic.2006.10.003

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Reference TypeJournal (article/letter/editorial)
TitleAn algorithm for refinement of lattice parameters using CBED patterns
JournalUltramicroscopy
AuthorsMorawiec, A.Author
Year2007 (April)Volume107
Issue4
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2006.10.003Search in ResearchGate
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Mindat Ref. ID4903822Long-form Identifiermindat:1:5:4903822:8
GUID0
Full ReferenceMorawiec, A. (2007) An algorithm for refinement of lattice parameters using CBED patterns. Ultramicroscopy, 107 (4). 390-395 doi:10.1016/j.ultramic.2006.10.003
Plain TextMorawiec, A. (2007) An algorithm for refinement of lattice parameters using CBED patterns. Ultramicroscopy, 107 (4). 390-395 doi:10.1016/j.ultramic.2006.10.003
In(2007, April) Ultramicroscopy Vol. 107 (4) Elsevier BV

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Brunetti, G., Bouzy, E., Fundenberger, J.J., Morawiec, A., Tidu, A. (2010) Determination of lattice parameters from multiple CBED patterns: A statistical approach. Ultramicroscopy, 110 (4). 269-277 doi:10.1016/j.ultramic.2009.11.004
Paczkowski, P, Gigla, M, Kostka, A, Morawiec, H (2003) The software tool for lattice parameters determination from nanoareas using CBED patterns. Materials Chemistry and Physics, 81. 233-236 doi:10.1016/s0254-0584(02)00557-6
Morawiec, A. (2007) A program for refinement of lattice parameters based on multiple convergent-beam electron diffraction patterns. Journal of Applied Crystallography, 40 (3). 618-622 doi:10.1107/s0021889807018262
Morawiec, A. (2016) A program for refinement of lattice parameters and strain determination using Kossel diffraction patterns. Journal of Applied Crystallography, 49 (1). 322-329 doi:10.1107/s1600576715024656
Dudka, A.P., Avilov, A.S., Nicolopoulos, S. (2007) Crystal structure refinement using Bloch-wave method for precession electron diffraction. Ultramicroscopy, 107 (6). 474-482 doi:10.1016/j.ultramic.2006.03.009
Morawiec, A., Bouzy, E., Paul, H., Fundenberger, J.J. (2014) Orientation precision of TEM-based orientation mapping techniques. Ultramicroscopy, 136. 107-118 doi:10.1016/j.ultramic.2013.08.008
Sridhara Rao, D.V., McLaughlin, K., Kappers, M.J., Humphreys, C.J. (2009) Lattice distortions in GaN on sapphire using the CBED–HOLZ technique. Ultramicroscopy, 109 (10). 1250-1255 doi:10.1016/j.ultramic.2009.05.018
Wittmann, R., Parzinger, C., Gerthsen, D. (1998) Quantitative determination of lattice parameters from CBED patterns: accuracy and performance. Ultramicroscopy, 70 (3). 145-159 doi:10.1016/s0304-3991(97)00107-1
Houdellier, F., Altibelli, A., Roucau, C., Casanove, M.J. (2008) New approach for the dynamical simulation of CBED patterns in heavily strained specimens. Ultramicroscopy, 108 (5). 426-432 doi:10.1016/j.ultramic.2007.06.002
Lai, Songcan, McLeod, Robert A., Jacquemin, Peter, Atalick, Stefan, Herring, Rodney (2007) An algorithm for 3-D refractive index measurement in holographic confocal microscopy. Ultramicroscopy, 107 (2). 196-201 doi:10.1016/j.ultramic.2006.07.002
Houdellier, F., Jacob, D., Casanove, M.J., Roucau, C. (2008) Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samples. Ultramicroscopy, 108 (4). 295-301 doi:10.1016/j.ultramic.2007.04.003
 
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