Winkelmann, Aimo, Nolze, Gert (2010) Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon. Ultramicroscopy, 110 (3). 190-194 doi:10.1016/j.ultramic.2009.11.008
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon | ||
Journal | Ultramicroscopy | ||
Authors | Winkelmann, Aimo | Author | |
Nolze, Gert | Author | ||
Year | 2010 (February) | Volume | 110 |
Issue | 3 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.ultramic.2009.11.008Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4905929 | Long-form Identifier | mindat:1:5:4905929:4 |
GUID | 0 | ||
Full Reference | Winkelmann, Aimo, Nolze, Gert (2010) Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon. Ultramicroscopy, 110 (3). 190-194 doi:10.1016/j.ultramic.2009.11.008 | ||
Plain Text | Winkelmann, Aimo, Nolze, Gert (2010) Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon. Ultramicroscopy, 110 (3). 190-194 doi:10.1016/j.ultramic.2009.11.008 | ||
In | (2010, February) Ultramicroscopy Vol. 110 (3) Elsevier BV |
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