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Baumann, Maximilian, Stark, Robert W. (2010) Dual frequency atomic force microscopy on charged surfaces. Ultramicroscopy, 110 (6). 578-581 doi:10.1016/j.ultramic.2010.02.013

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Reference TypeJournal (article/letter/editorial)
TitleDual frequency atomic force microscopy on charged surfaces
JournalUltramicroscopy
AuthorsBaumann, MaximilianAuthor
Stark, Robert W.Author
Year2010 (May)Volume110
Issue6
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.02.013Search in ResearchGate
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Mindat Ref. ID4906119Long-form Identifiermindat:1:5:4906119:2
GUID0
Full ReferenceBaumann, Maximilian, Stark, Robert W. (2010) Dual frequency atomic force microscopy on charged surfaces. Ultramicroscopy, 110 (6). 578-581 doi:10.1016/j.ultramic.2010.02.013
Plain TextBaumann, Maximilian, Stark, Robert W. (2010) Dual frequency atomic force microscopy on charged surfaces. Ultramicroscopy, 110 (6). 578-581 doi:10.1016/j.ultramic.2010.02.013
In(2010, May) Ultramicroscopy Vol. 110 (6) Elsevier BV

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