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Lányi, Š., Nádaždy, V. (2010) Scanning Probe Microscope based Deep-Level Spectroscopy of semiconductor films. Ultramicroscopy, 110 (6). 655-658 doi:10.1016/j.ultramic.2010.02.027

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Reference TypeJournal (article/letter/editorial)
TitleScanning Probe Microscope based Deep-Level Spectroscopy of semiconductor films
JournalUltramicroscopy
AuthorsLányi, Š.Author
Nádaždy, V.Author
Year2010 (May)Volume110
Issue6
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.02.027Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4906162Long-form Identifiermindat:1:5:4906162:4
GUID0
Full ReferenceLányi, Š., Nádaždy, V. (2010) Scanning Probe Microscope based Deep-Level Spectroscopy of semiconductor films. Ultramicroscopy, 110 (6). 655-658 doi:10.1016/j.ultramic.2010.02.027
Plain TextLányi, Š., Nádaždy, V. (2010) Scanning Probe Microscope based Deep-Level Spectroscopy of semiconductor films. Ultramicroscopy, 110 (6). 655-658 doi:10.1016/j.ultramic.2010.02.027
In(2010, May) Ultramicroscopy Vol. 110 (6) Elsevier BV

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