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Kaisei, Kiyohiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2010) Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip. Ultramicroscopy, 110 (6). 733-736 doi:10.1016/j.ultramic.2010.02.041

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Reference TypeJournal (article/letter/editorial)
TitleFabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip
JournalUltramicroscopy
AuthorsKaisei, KiyohiroAuthor
Kobayashi, KeiAuthor
Matsushige, KazumiAuthor
Yamada, HirofumiAuthor
Year2010 (May)Volume110
Issue6
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.02.041Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4906209Long-form Identifiermindat:1:5:4906209:4
GUID0
Full ReferenceKaisei, Kiyohiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2010) Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip. Ultramicroscopy, 110 (6). 733-736 doi:10.1016/j.ultramic.2010.02.041
Plain TextKaisei, Kiyohiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2010) Fabrication of ionic liquid thin film by nano-inkjet printing method using atomic force microscope cantilever tip. Ultramicroscopy, 110 (6). 733-736 doi:10.1016/j.ultramic.2010.02.041
In(2010, May) Ultramicroscopy Vol. 110 (6) Elsevier BV

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Kaisei, Kiyohiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2010) Ionic Liquid Thin Film Fabrication Using Nano-Inkjet Printing Method. Japanese Journal of Applied Physics, 49 (6) 6 doi:10.1143/jjap.49.06gh02
Kaisei, Kiyohiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2012) Fabrication of glycerol liquid droplet array by nano-inkjet printing method. Journal of Applied Physics, 111 (7). 74319pp. doi:10.1063/1.3699388
Kimura, Kuniko, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2013) Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniques. Ultramicroscopy, 133. 41-49 doi:10.1016/j.ultramic.2013.04.003
Umeda, Ken-ichi, Kobayashi, Kei, Oyabu, Noriaki, Hirata, Yoshiki, Matsushige, Kazumi, Yamada, Hirofumi (2013) Analysis of capacitive force acting on a cantilever tip at solid/liquid interfaces. Journal of Applied Physics, 113 (15). 154311pp. doi:10.1063/1.4801795
Satoh, Nobuo, Katori, Shigetaka, Kobayashi, Kei, Watanabe, Shunji, Fujii, Toru, Matsushige, Kazumi, Yamada, Hirofumi (2011) Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever. Journal of Applied Physics, 109 (11). 114306pp. doi:10.1063/1.3585865
Fukuma, Takeshi, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2005) True atomic resolution in liquid by frequency-modulation atomic force microscopy. Applied Physics Letters, 87 (3). 34101pp. doi:10.1063/1.1999856
Fukuma, Takeshi, Kimura, Kenjiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2005) Frequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection method. Review of Scientific Instruments, 76 (12). 126110pp. doi:10.1063/1.2149004
Yamasue, Kohei, Kobayashi, Kei, Yamada, Hirofumi, Matsushige, Kazumi, Hikihara, Takashi (2009) Controlling chaos in dynamic-mode atomic force microscope. Physics Letters A, 373. 3140-3144 doi:10.1016/j.physleta.2009.07.009
Fukuma, Takeshi, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2005) True molecular resolution in liquid by frequency-modulation atomic force microscopy. Applied Physics Letters, 86 (19). 193108pp. doi:10.1063/1.1925780
Miyato, Yuji, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2010) Surface Potential Investigation of Carbon Nanotube Field-Effect Transistor by Point-by-Point Atomic Force Microscope Potentiometry. Japanese Journal of Applied Physics, 49 (2) 2 doi:10.1143/jjap.49.02bd03
Fukuma, Takeshi, Kimura, Kenjiro, Kobayashi, Kei, Matsushige, Kazumi, Yamada, Hirofumi (2004) Dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam deflection method. Applied Physics Letters, 85 (25). 6287-6289 doi:10.1063/1.1842368
 
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