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Field, Michael, Merchant, M. Eugene (1949) Reflection Method of Determining Preferred Orientation on the Geiger‐Counter Spectrometer. Journal of Applied Physics, 20 (8). 741-745 doi:10.1063/1.1698522

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Reference TypeJournal (article/letter/editorial)
TitleReflection Method of Determining Preferred Orientation on the Geiger‐Counter Spectrometer
JournalJournal of Applied Physics
AuthorsField, MichaelAuthor
Merchant, M. EugeneAuthor
Year1949 (August)Volume20
Issue8
PublisherAIP Publishing
DOIdoi:10.1063/1.1698522
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Mindat Ref. ID4906213Long-form Identifiermindat:1:5:4906213:7
GUID0
Full ReferenceField, Michael, Merchant, M. Eugene (1949) Reflection Method of Determining Preferred Orientation on the Geiger‐Counter Spectrometer. Journal of Applied Physics, 20 (8). 741-745 doi:10.1063/1.1698522
Plain TextField, Michael, Merchant, M. Eugene (1949) Reflection Method of Determining Preferred Orientation on the Geiger‐Counter Spectrometer. Journal of Applied Physics, 20 (8). 741-745 doi:10.1063/1.1698522
In(1949, August) Journal of Applied Physics Vol. 20 (8) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Schulz, L. G. (1949) A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X‐Ray Spectrometer. Journal of Applied Physics, 20 (11). 1030-1033 doi:10.1063/1.1698268
Schulz, L. G. (1949) Determination of Preferred Orientation in Flat Transmission Samples Using a Geiger Counter X‐Ray Spectrometer. Journal of Applied Physics, 20 (11). 1033-1036 doi:10.1063/1.1698269
Alexander, Leroy, Kummer, Elizabeth, Klug, Harold P. (1949) Dead Time and Non‐Linearity Characteristics of the Geiger‐Counter X‐Ray Spectrometer. Journal of Applied Physics, 20 (8). 735-740 doi:10.1063/1.1698521
Smoluchowski, R., Turner, R. W. (1949) Influence of Magnetic Field on Recrystallization. Journal of Applied Physics, 20 (8). 745-746 doi:10.1063/1.1698523
Decker, B. F., Asp, E. T., Harker, D. (1948) Preferred Orientation Determination Using a Geiger Counter X‐Ray Diffraction Goniometer. Journal of Applied Physics, 19 (4). 388-392 doi:10.1063/1.1715077
Ter‐Pogossian, Michel, Robinson, J. Eugene, Townsend, J. (1949) Pressure Regulated Thin Window Geiger‐Mueller Counter. Review of Scientific Instruments, 20 (4). 289-290 doi:10.1063/1.1741509
Tenckhoff, E. (1970) Defocusing for the Schulz Technique of Determining Preferred Orientation. Journal of Applied Physics, 41 (10). 3944-3948 doi:10.1063/1.1658393
Wilchinsky, Zigmond W. (1947) Quantitative Analysis of Mixed Powders with the Geiger‐Counter X‐Ray Spectrometer. Journal of Applied Physics, 18 (10). 929 doi:10.1063/1.1697569
Crane, H. R. (1949) Automatic Stabilization of the Overvoltage on a Geiger Counter. Review of Scientific Instruments, 20 (12). 955-956 doi:10.1063/1.1741439
Johnson, James R. (1949) Erratum: Photo‐Density Method of Determining the Relative Penetration of Diffused Sodium 24 Tracer into Glass. Journal of Applied Physics, 20 (8). 819 doi:10.1063/1.1698539
Robinson, Charles F. (1949) The Effect of Space Charge on the Focusing Properties of a 180° Mass Spectrometer. Review of Scientific Instruments, 20 (10). 745 doi:10.1063/1.1741369
 
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