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Palacios-Lidón, E., Munuera, C., Ocal, C., Colchero, J. (2010) Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?. Ultramicroscopy, 110 (7). 789-800 doi:10.1016/j.ultramic.2010.01.015

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Reference TypeJournal (article/letter/editorial)
TitleContrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?
JournalUltramicroscopy
AuthorsPalacios-Lidón, E.Author
Munuera, C.Author
Ocal, C.Author
Colchero, J.Author
Year2010 (June)Volume110
Issue7
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.01.015Search in ResearchGate
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Mindat Ref. ID4906247Long-form Identifiermindat:1:5:4906247:4
GUID0
Full ReferencePalacios-Lidón, E., Munuera, C., Ocal, C., Colchero, J. (2010) Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?. Ultramicroscopy, 110 (7). 789-800 doi:10.1016/j.ultramic.2010.01.015
Plain TextPalacios-Lidón, E., Munuera, C., Ocal, C., Colchero, J. (2010) Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?. Ultramicroscopy, 110 (7). 789-800 doi:10.1016/j.ultramic.2010.01.015
In(2010, June) Ultramicroscopy Vol. 110 (7) Elsevier BV

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Palacios-Lidón, E., Abellán, J., Colchero, J., Munuera, C., Ocal, C. (2005) Quantitative electrostatic force microscopy on heterogeneous nanoscale samples. Applied Physics Letters, 87 (15). 154106pp. doi:10.1063/1.2099527
Colchero, J., Cuenca, M., Martínez, J. F. González, Abad, J., García, B. Pérez, Palacios-Lidón, E., Abellán, J. (2011) Thermal frequency noise in dynamic scanning force microscopy. Journal of Applied Physics, 109 (2). 24310pp. doi:10.1063/1.3533769
Colchero, J., Francisco González Martínez, Juan, Abad, José, Pérez García, B., Cuenca, M., Palacios-Lidón, E., Abellán, J. (2011) Response to the “Comment on ‘Thermal frequency noise in dynamic scanning force microscopy’” [J. Appl. Phys. 110, 036107 (2011)]. Journal of Applied Physics, 110 (3). 36108pp. doi:10.1063/1.3619795
López-Elvira, E., García-Pérez, B., Colchero, J., Palacios-Lidón, E. (2011) Surface characterization of P3OT thin films by variable temperature scanning force microscopy. Synthetic Metals, 161 (15). 1651-1659 doi:10.1016/j.synthmet.2011.05.035
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Munuera, C., Ocal, C. (2006) Real time scanning force microscopy observation of a structural phase transition in self-assembled alkanethiols. The Journal of Chemical Physics, 124 (20). 206102pp. doi:10.1063/1.2198195
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Jalabert, Rodolfo A., Szewc, Wojciech, Tomsovic, Steven, Weinmann, Dietmar (2010) What Is Measured in the Scanning Gate Microscopy of a Quantum Point Contact?. Physical Review Letters, 105 (16). doi:10.1103/physrevlett.105.166802
Jung, Mi, Choi, Jeong-Woo (2010) Distinction of heterogeneity on Au nanostructured surface based on phase contrast imaging of atomic force microscopy. Ultramicroscopy, 110 (6). 670-675 doi:10.1016/j.ultramic.2010.02.030
 
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