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Philippe, T., Duguay, S., Blavette, D. (2010) Clustering and pair correlation function in atom probe tomography. Ultramicroscopy, 110 (7). 862-865 doi:10.1016/j.ultramic.2010.03.004

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Reference TypeJournal (article/letter/editorial)
TitleClustering and pair correlation function in atom probe tomography
JournalUltramicroscopy
AuthorsPhilippe, T.Author
Duguay, S.Author
Blavette, D.Author
Year2010 (June)Volume110
Issue7
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.03.004Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4906282Long-form Identifiermindat:1:5:4906282:7
GUID0
Full ReferencePhilippe, T., Duguay, S., Blavette, D. (2010) Clustering and pair correlation function in atom probe tomography. Ultramicroscopy, 110 (7). 862-865 doi:10.1016/j.ultramic.2010.03.004
Plain TextPhilippe, T., Duguay, S., Blavette, D. (2010) Clustering and pair correlation function in atom probe tomography. Ultramicroscopy, 110 (7). 862-865 doi:10.1016/j.ultramic.2010.03.004
In(2010, June) Ultramicroscopy Vol. 110 (7) Elsevier BV

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Philippe, T., Duguay, S., Grancher, G., Blavette, D. (2013) Point process statistics in atom probe tomography. Ultramicroscopy, 132. 114-120 doi:10.1016/j.ultramic.2012.10.004
Philippe, T., De Geuser, F., Duguay, S., Lefebvre, W., Cojocaru-Mirédin, O., Da Costa, G., Blavette, D. (2009) Clustering and nearest neighbour distances in atom-probe tomography. Ultramicroscopy, 109 (10). 1304-1309 doi:10.1016/j.ultramic.2009.06.007
Dumas, P., Duguay, S., Borrel, J., Hilario, F., Blavette, D. (2021) Atom probe tomography quantification of carbon in silicon. Ultramicroscopy, 220. 113153pp. doi:10.1016/j.ultramic.2020.113153
PHILIPPE, T., COJOCARU-MIRÉDIN, O., DUGUAY, S., BLAVETTE, D. (2010) Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfaces. Journal of Microscopy, 239 (1). 72-77 doi:10.1111/j.1365-2818.2009.03359.x
Blavette, D., Duguay, S. (2016) Investigation of dopant clustering and segregation to defects in semiconductors using atom probe tomography. Journal of Applied Physics, 119 (18). 181502pp. doi:10.1063/1.4948238
Estivill, Robert, Grenier, Adeline, Duguay, Sébastien, Vurpillot, François, Terlier, Tanguy, Barnes, Jean-Paul, Hartmann, Jean-Michel, Blavette, Didier (2015) Quantitative investigation of SiGeC layers using atom probe tomography. Ultramicroscopy, 150. 23-29 doi:10.1016/j.ultramic.2014.11.020
Estivill, Robert, Grenier, Adeline, Duguay, Sébastien, Vurpillot, François, Terlier, Tanguy, Barnes, Jean-Paul, Hartmann, Jean-Michel, Blavette, Didier (2015) Quantitative analysis of Si/SiGeC superlattices using atom probe tomography. Ultramicroscopy, 159. 223-231 doi:10.1016/j.ultramic.2015.03.014
Rolland, N., Larson, D.J., Geiser, B.P., Duguay, S., Vurpillot, F., Blavette, D. (2015) An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials. Ultramicroscopy, 159. 195-201 doi:10.1016/j.ultramic.2015.03.010
Philippe, Thomas, Gruber, Maria, Vurpillot, François, Blavette, D. (2010) Clustering and Local Magnification Effects in Atom Probe Tomography: A Statistical Approach. Microscopy and Microanalysis, 16 (5). 643-648 doi:10.1017/s1431927610000449
Parish, C.M., Miller, M.K. (2011) Erratum to “Multivariate statistical analysis of atom probe tomography data” [Ultramicroscopy 110 (2010) 1362]. Ultramicroscopy, 111 (9). 1522pp. doi:10.1016/j.ultramic.2011.02.003
Parish, Chad M., Miller, Michael K. (2010) Multivariate statistical analysis of atom probe tomography data. Ultramicroscopy, 110 (11). 1362-1373 doi:10.1016/j.ultramic.2010.07.006
 
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