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Findlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y. (2010) Dynamics of annular bright field imaging in scanning transmission electron microscopy. Ultramicroscopy, 110 (7). 903-923 doi:10.1016/j.ultramic.2010.04.004

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Reference TypeJournal (article/letter/editorial)
TitleDynamics of annular bright field imaging in scanning transmission electron microscopy
JournalUltramicroscopy
AuthorsFindlay, S.D.Author
Shibata, N.Author
Sawada, H.Author
Okunishi, E.Author
Kondo, Y.Author
Ikuhara, Y.Author
Year2010 (June)Volume110
Issue7
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.04.004Search in ResearchGate
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Mindat Ref. ID4906307Long-form Identifiermindat:1:5:4906307:5
GUID0
Full ReferenceFindlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y. (2010) Dynamics of annular bright field imaging in scanning transmission electron microscopy. Ultramicroscopy, 110 (7). 903-923 doi:10.1016/j.ultramic.2010.04.004
Plain TextFindlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y. (2010) Dynamics of annular bright field imaging in scanning transmission electron microscopy. Ultramicroscopy, 110 (7). 903-923 doi:10.1016/j.ultramic.2010.04.004
In(2010, June) Ultramicroscopy Vol. 110 (7) Elsevier BV

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Findlay, SD, Shibata, N, Sawada, H, Okunishi, E, Kondo, Y, Azuma, S, Ikuhara, Y (2010) Annular Bright Field Scanning Transmission Electron Microscopy Imaging Dynamics. Microscopy and Microanalysis, 16. 80-81 doi:10.1017/s143192761005484x
Findlay, S.D., Lugg, N.R., Shibata, N., Allen, L.J., Ikuhara, Y. (2011) Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study. Ultramicroscopy, 111 (8). 1144-1154 doi:10.1016/j.ultramic.2011.03.005
Findlay, S.D., Kohno, Y., Cardamone, L.A., Ikuhara, Y., Shibata, N. (2014) Enhanced light element imaging in atomic resolution scanning transmission electron microscopy. Ultramicroscopy, 136. 31-41 doi:10.1016/j.ultramic.2013.07.019
Findlay, S. D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Yamamoto, T., Ikuhara, Y. (2009) Robust atomic resolution imaging of light elements using scanning transmission electron microscopy. Applied Physics Letters, 95 (19). 191913pp. doi:10.1063/1.3265946
Lugg, N.R., Findlay, S.D., Shibata, N., Mizoguchi, T., D’Alfonso, A.J., Allen, L.J., Ikuhara, Y. (2011) Scanning transmission electron microscopy imaging dynamics at low accelerating voltages. Ultramicroscopy, 111 (8). 999-1013 doi:10.1016/j.ultramic.2011.02.009
Findlay, Scott D., Shibata, Naoya, Ikuhara, Yuichi, Huang, Rong, Okunishi, Eiji, Sawada, Hidetaka, Kohno, Yuji, Kondo, Yukihito (2017) Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials. Microscopy Today, 25 (6). 36-41 doi:10.1017/s1551929517001006
Shibata, N., Findlay, S.D., Ikuhara, Y. (2014) Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector. Microscopy and Microanalysis, 20. 64-65 doi:10.1017/s1431927614002049
Findlay, S.D., Shibata, N., Ikuhara, Y. (2009) What atomic resolution annular dark field imaging can tell us about gold nanoparticles on TiO2 (110). Ultramicroscopy, 109 (12). 1435-1446 doi:10.1016/j.ultramic.2009.07.006
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Shibata, N, Findlay, SD, Kohno, Y, Sawada, H, Kondo, Y, Ikuhara, Y (2010) Atomic-Resolution STEM Imaging of Materials Using a Segmented Annular All Field Detector. Microscopy and Microanalysis, 16. 124-125 doi:10.1017/s1431927610058083
Kohno, Y, Shibata, N, Sawada, H, Findlay, SD, Kondo, Y, Ikuhara, Y (2010) Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes. Microscopy and Microanalysis, 16. 760-761 doi:10.1017/s1431927610057120
 
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