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Reed, B. W., LaGrange, T., Shuttlesworth, R. M., Gibson, D. J., Campbell, G. H., Browning, N. D. (2010) Solving the accelerator-condenser coupling problem in a nanosecond dynamic transmission electron microscope. Review of Scientific Instruments, 81 (5). 53706pp. doi:10.1063/1.3427234

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Reference TypeJournal (article/letter/editorial)
TitleSolving the accelerator-condenser coupling problem in a nanosecond dynamic transmission electron microscope
JournalReview of Scientific Instruments
AuthorsReed, B. W.Author
LaGrange, T.Author
Shuttlesworth, R. M.Author
Gibson, D. J.Author
Campbell, G. H.Author
Browning, N. D.Author
Year2010 (May)Volume81
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.3427234Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4906324Long-form Identifiermindat:1:5:4906324:2
GUID0
Full ReferenceReed, B. W., LaGrange, T., Shuttlesworth, R. M., Gibson, D. J., Campbell, G. H., Browning, N. D. (2010) Solving the accelerator-condenser coupling problem in a nanosecond dynamic transmission electron microscope. Review of Scientific Instruments, 81 (5). 53706pp. doi:10.1063/1.3427234
Plain TextReed, B. W., LaGrange, T., Shuttlesworth, R. M., Gibson, D. J., Campbell, G. H., Browning, N. D. (2010) Solving the accelerator-condenser coupling problem in a nanosecond dynamic transmission electron microscope. Review of Scientific Instruments, 81 (5). 53706pp. doi:10.1063/1.3427234
In(2010, May) Review of Scientific Instruments Vol. 81 (5) AIP Publishing

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Campbell, G. H., LaGrange, T., Kim, J. S., Reed, B. W., Browning, N. D. (2010) Quantifying transient states in materials with the dynamic transmission electron microscope. Journal of Electron Microscopy, 59. doi:10.1093/jmicro/dfq032
LaGrange, T., Armstrong, M. R., Boyden, K., Brown, C. G., Campbell, G. H., Colvin, J. D., DeHope, W. J., Frank, A. M., Gibson, D. J., Hartemann, F. V., Kim, J. S., King, W. E., Pyke, B. J., Reed, B. W., Shirk, M. D., Shuttlesworth, R. M., Stuart, B. C., Torralva, B. R., Browning, N. D. (2006) Single-shot dynamic transmission electron microscopy. Applied Physics Letters, 89 (4). 44105pp. doi:10.1063/1.2236263
Santala, M. K., Reed, B. W., Topuria, T., Raoux, S., Meister, S., Cui, Y., LaGrange, T., Campbell, G. H., Browning, N. D. (2012) Nanosecond in situ transmission electron microscope studies of the reversible Ge2Sb2Te5 crystalline ⇔ amorphous phase transformation. Journal of Applied Physics, 111 (2). 24309pp. doi:10.1063/1.3678447
LaGrange, Thomas, Campbell, Geoffrey H., Reed, B.W., Taheri, Mitra, Pesavento, J. Bradley, Kim, Judy S., Browning, Nigel D. (2008) Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM). Ultramicroscopy, 108 (11). 1441-1449 doi:10.1016/j.ultramic.2008.03.013
Nikolova, L., LaGrange, T., Reed, B. W., Stern, M. J., Browning, N. D., Campbell, G. H., Kieffer, J.-C., Siwick, B. J., Rosei, F. (2010) Nanocrystallization of amorphous germanium films observed with nanosecond temporal resolution. Applied Physics Letters, 97 (20). 203102pp. doi:10.1063/1.3518069
Armstrong, Michael R., Boyden, Ken, Browning, Nigel D., Campbell, Geoffrey H., Colvin, Jeffrey D., DeHope, William J., Frank, Alan M., Gibson, David J., Hartemann, Fred, Kim, Judy S., King, Wayne E., LaGrange, Thomas B., Pyke, Ben J., Reed, Bryan W., Shuttlesworth, Richard M., Stuart, Brent C., Torralva, Ben R. (2007) Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy. Ultramicroscopy, 107 (4). 356-367 doi:10.1016/j.ultramic.2006.09.005
Taheri, M. L., McGowan, S., Nikolova, L., Evans, J. E., Teslich, N., Lu, J. P., LaGrange, T., Rosei, F., Siwick, B. J., Browning, N. D. (2010) In situ laser crystallization of amorphous silicon: Controlled nanosecond studies in the dynamic transmission electron microscope. Applied Physics Letters, 97 (3). 32102pp. doi:10.1063/1.3422473
LaGrange, T., Reed, B.W., McKeown, J.T., Santala, M.K., Dehope, W.J., Huete, G., Shuttlesworth, R.M., Campbell, G.H. (2013) Movie Mode Dynamic Transmission Electron Microscope: Revealing Material Processes at Nanometer and Nanosecond Scales with Multi-frame Acquisition. Microscopy and Microanalysis, 19. 1154-1155 doi:10.1017/s1431927613007769
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Campbell, GH, LaGrange, TB, King, WE, Browning, ND, Armstrong, MR, Kim, JS, Reed, BW, Frank, AM, Stuart, BC, DeHope, WJ, Pyke, BJ, Shuttlesworth, RM, Hartemann, FV, Gibson, DJ (2006) Applying the Dynamic Transmission Electron Microscope to Study Fast Processes in Materials. Microscopy and Microanalysis, 12. 1428-1429 doi:10.1017/s1431927606063926
Santala, MK, Reed, BW, Meister, S, LaGrange, TB, Evans, JE, Campbell, GH, Browning, ND (2010) Dynamic Transmission Electron Microscope Investigations of Dynamic Processes in Materials. Microscopy and Microanalysis, 16. 512-513 doi:10.1017/s1431927610057818
 
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