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Boyer, R. F. (1950) Random Noise in Dielectric Materials. Journal of Applied Physics, 21 (6). 469-477 doi:10.1063/1.1699688

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Reference TypeJournal (article/letter/editorial)
TitleRandom Noise in Dielectric Materials
JournalJournal of Applied Physics
AuthorsBoyer, R. F.Author
Year1950 (June)Volume21
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.1699688
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Mindat Ref. ID4906949Long-form Identifiermindat:1:5:4906949:5
GUID0
Full ReferenceBoyer, R. F. (1950) Random Noise in Dielectric Materials. Journal of Applied Physics, 21 (6). 469-477 doi:10.1063/1.1699688
Plain TextBoyer, R. F. (1950) Random Noise in Dielectric Materials. Journal of Applied Physics, 21 (6). 469-477 doi:10.1063/1.1699688
In(1950, June) Journal of Applied Physics Vol. 21 (6) AIP Publishing

See Also

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Bauss, Herbert, Boyer, R. F. (1952) Random Noise in Dielectrics. Journal of Applied Physics, 23 (7). 802-803 doi:10.1063/1.1702311
Mason, J. H. (1951) Random Noise in Dielectric Materials. Journal of Applied Physics, 22 (2). 235-236 doi:10.1063/1.1699934
Gossick, Ben R. (1950) Distribution in Energy of Johnson Noise Pulses. Journal of Applied Physics, 21 (9). 847-850 doi:10.1063/1.1699771
Hetrick, David L. (1950) Propagation of theTM01Mode in a Metal Tube Containing an Imperfect Dielectric. Journal of Applied Physics, 21 (6). 561-564 doi:10.1063/1.1699707
Ivey, Henry F. (1950) Use of Brightness Temperatures in Richardson Plots. Journal of Applied Physics, 21 (6). 616-617 doi:10.1063/1.1699718
Hawkins, R. J. (1972) Modified Random‐Walk Model for 1/f Noise. Journal of Applied Physics, 43 (3). 1276-1277 doi:10.1063/1.1661251
Van Der Ziel, A. (1950) Thermal Noise at High Frequencies. Journal of Applied Physics, 21 (5). 399-401 doi:10.1063/1.1699673
Buchdahl, Rolf, Nielsen, Lawrence E. (1950) Transitions in High Polymeric Materials. Journal of Applied Physics, 21 (6). 482-487 doi:10.1063/1.1699690
Boyer, R. F. (1951) Relation of Tensile Strength to Brittle Temperature in Plasticized Polymers. Journal of Applied Physics, 22 (6). 723-729 doi:10.1063/1.1700038
Chung, Steve S., Chang, C. M. (2008) The investigation of capture/emission mechanism in high-k gate dielectric soft breakdown by gate current random telegraph noise approach. Applied Physics Letters, 93 (21). 213502pp. doi:10.1063/1.3036681
Salvino, R. E., Buot, F. A. (1993) Random telegraphic noise in double barrier systems. Applied Physics Letters, 63 (19). 2652-2654 doi:10.1063/1.110410
 
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