Suchorski, Yuri, Schmitz, Guido (2011) IFES 2010 proceedings of the 52nd international field Emission symposium. Ultramicroscopy, 111 (6). doi:10.1016/s0304-3991(11)00102-1
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | IFES 2010 proceedings of the 52nd international field Emission symposium | ||
Journal | Ultramicroscopy | ||
Authors | Suchorski, Yuri | Author | |
Schmitz, Guido | Author | ||
Year | 2011 (May) | Volume | 111 |
Issue | 6 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0304-3991(11)00102-1Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4906983 | Long-form Identifier | mindat:1:5:4906983:9 |
GUID | 0 | ||
Full Reference | Suchorski, Yuri, Schmitz, Guido (2011) IFES 2010 proceedings of the 52nd international field Emission symposium. Ultramicroscopy, 111 (6). doi:10.1016/s0304-3991(11)00102-1 | ||
Plain Text | Suchorski, Yuri, Schmitz, Guido (2011) IFES 2010 proceedings of the 52nd international field Emission symposium. Ultramicroscopy, 111 (6). doi:10.1016/s0304-3991(11)00102-1 | ||
In | (2011, May) Ultramicroscopy Vol. 111 (6) Elsevier BV |
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