(2011, June) Ultramicroscopy Vol. 111 (7) Elsevier BV

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Reference Type	Journal (issue)
Journal	Ultramicroscopy
Year	2011 (June)	Volume	111
Issue	< 7 >
Publisher	Elsevier BV
Mindat Ref. ID	4906992	Long-form Identifier	mindat:1:5:4906992:7
GUID	0
Full Reference	(2011, June) Ultramicroscopy Vol. 111 (7) Elsevier BV
Plain Text	(2011, June) Ultramicroscopy Vol. 111 (7) Elsevier BV
In	(2010) Ultramicroscopy Vol. 111. Elsevier BV

Contains

	*(2011) IFC (Editorial Board). Ultramicroscopy, 111 (7). doi:10.1016/s0304-3991(11)00126-4*
	*Koch, Christoph, Zuo, Jian-Min, Chapman, Henry (2011) J. Spence's 65th birthday. Ultramicroscopy, 111 (7). doi:10.1016/s0304-3991(11)00131-8*
	*(2011) Contents. Ultramicroscopy, 111 (7). doi:10.1016/s0304-3991(11)00132-x*
	Koch, Christoph T., Zuo, Jian-Min, Chapman, Henry (2011) Introduction to the special issue in honor of Regents' Prof. John C.H. Spence in occasion of his 65th birthday. Ultramicroscopy, 111 (7). 745-746 doi:10.1016/j.ultramic.2011.03.017
	*Hawkes, P.W. (2011) Should it be ‘picoscopy’?. Ultramicroscopy, 111 (7). 747-760 doi:10.1016/j.ultramic.2010.10.004*
	*Howie, A. (2011) Mechanisms of decoherence in electron microscopy. Ultramicroscopy, 111 (7). 761-767 doi:10.1016/j.ultramic.2010.07.008*
	Fullagar, Wilfred K., Paganin, David M., Hall, Chris J. (2011) Revisiting Bragg's X-ray microscope: Scatter based optical transient grating detection of pulsed ionising radiation. Ultramicroscopy, 111 (7). 768-776 doi:10.1016/j.ultramic.2010.11.024
	Martin, A.V., Bishop, A.I., Paganin, D.M., Allen, L.J. (2011) Practical implementation of a direct method for coherent diffractive imaging. Ultramicroscopy, 111 (7). 777-781 doi:10.1016/j.ultramic.2010.10.003
	Podorov, Sergey G., Bishop, Alexis I., Paganin, David M., Pavlov, Konstantin M. (2011) Mask-assisted deterministic phase–amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light. Ultramicroscopy, 111 (7). 782-787 doi:10.1016/j.ultramic.2011.01.011
	*Elser, Veit (2011) Strategies for processing diffraction data from randomly oriented particles. Ultramicroscopy, 111 (7). 788-792 doi:10.1016/j.ultramic.2010.10.014*
	Ziaja, B., Martin, A.V., Wang, F., Chapman, H.N., Weckert, E. (2011) Theoretical estimation for correlations of diffraction patterns from objects differently oriented in space. Ultramicroscopy, 111 (7). 793-797 doi:10.1016/j.ultramic.2010.12.021
	Poon, H.C., Saldin, D.K. (2011) Beyond the crystallization paradigm: Structure determination from diffraction patterns from ensembles of randomly oriented particles. Ultramicroscopy, 111 (7). 798-806 doi:10.1016/j.ultramic.2010.11.003
	*Maia, Filipe R.N.C., Yang, Chao, Marchesini, Stefano (2011) Compressive auto-indexing in femtosecond nanocrystallography. Ultramicroscopy, 111 (7). 807-811 doi:10.1016/j.ultramic.2010.10.016*
	Wu, Jinsong, Sheng Zhao, Yong, Hu, Hefei, Huang, Jiaxing, Zuo, Jian-Min, Dravid, Vinayak P. (2011) Construction of an organic crystal structural model based on combined electron and powder X-ray diffraction data and the charge flipping algorithm. Ultramicroscopy, 111 (7). 812-816 doi:10.1016/j.ultramic.2010.09.004
	Zuo, Jian-Min, Zhang, Jiong, Huang, Weijie, Ran, Ke, Jiang, Bin (2011) Combining real and reciprocal space information for aberration free coherent electron diffractive imaging. Ultramicroscopy, 111 (7). 817-823 doi:10.1016/j.ultramic.2010.10.013
	Deponte, D.P., Mckeown, J.T., Weierstall, U., Doak, R.B., Spence, J.C.H. (2011) Towards ETEM serial crystallography: Electron diffraction from liquid jets. Ultramicroscopy, 111 (7). 824-827 doi:10.1016/j.ultramic.2010.11.036
	*Koch, Christoph T. (2011) Aberration-compensated large-angle rocking-beam electron diffraction. Ultramicroscopy, 111 (7). 828-840 doi:10.1016/j.ultramic.2010.12.014*
	Nakashima, Philip N.H., Moodie, Alexander F., Etheridge, Joanne (2011) A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns. Ultramicroscopy, 111 (7). 841-846 doi:10.1016/j.ultramic.2011.01.044
	Sæterli, R., Flage-Larsen, E., Friis, J., Løvvik, O.M., Pacaud, J., Marthinsen, K., Holmestad, R. (2011) Experimental and theoretical study of electron density and structure factors in CoSb3. Ultramicroscopy, 111 (7). 847-853 doi:10.1016/j.ultramic.2010.08.002
	Valset, K., Tafto, J. (2011) Bloch wave symmetries in electron diffraction: Applications to Friedels law, Gjonnes–Moodie lines and refraction at interfaces. Ultramicroscopy, 111 (7). 854-859 doi:10.1016/j.ultramic.2010.08.003
	*Jiang, Nan, Spence, John C.H. (2011) In situ EELS study of dehydration of Al(OH)3 by electron beam irradiation. Ultramicroscopy, 111 (7). 860-864 doi:10.1016/j.ultramic.2010.11.004*
	Inada, H., Su, D., Egerton, R.F., Konno, M., Wu, L., Ciston, J., Wall, J., Zhu, Y. (2011) Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms. Ultramicroscopy, 111 (7). 865-876 doi:10.1016/j.ultramic.2010.10.002
	Wang, Peng, Behan, Gavin, Kirkland, Angus I., Nellist, Peter D., Cosgriff, Eireann C., D’Alfonso, Adrian J., Morgan, Andrew J., Allen, Leslie J., Hashimoto, Ayako, Takeguchi, Masaki, Mitsuishi, Kazutaka, Shimojo, Masayuki (2011) Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Ultramicroscopy, 111 (7). 877-886 doi:10.1016/j.ultramic.2010.10.012
	*Verbeeck, Jo, Bertoni, Giovanni, Lichte, Hannes (2011) A holographic biprism as a perfect energy filter?. Ultramicroscopy, 111 (7). 887-893 doi:10.1016/j.ultramic.2011.01.042*
	*Van Dyck, D. (2011) Persistent misconceptions about incoherence in electron microscopy. Ultramicroscopy, 111 (7). 894-900 doi:10.1016/j.ultramic.2011.01.007*
	Ciston, J., Kim, J.S., Haigh, S.J., Kirkland, A.I., Marks, L.D. (2011) Optimized conditions for imaging the effects of bonding charge density in electron microscopy. Ultramicroscopy, 111 (7). 901-911 doi:10.1016/j.ultramic.2010.12.003
	Xu, Qiang, Zandbergen, Henny W., Van Dyck, Dirk (2011) Applying an information transmission approach to extract valence electron information from reconstructed exit waves. Ultramicroscopy, 111 (7). 912-919 doi:10.1016/j.ultramic.2011.01.032
	Barthel, J., Thust, A. (2011) REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns. Ultramicroscopy, 111 (7). 920-939 doi:10.1016/j.ultramic.2011.01.010
	Van den Broek, W., Van Aert, S., Goos, P., Van Dyck, D. (2011) Throughput maximization of particle radius measurements through balancing size versus current of the electron probe. Ultramicroscopy, 111 (7). 940-947 doi:10.1016/j.ultramic.2010.11.025
	Chen, Qing, Peng, Lian-Mao (2011) Fabrication and electric measurements of nanostructures inside transmission electron microscope. Ultramicroscopy, 111 (7). 948-954 doi:10.1016/j.ultramic.2011.01.043

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	*(2011, November) Ultramicroscopy* Vol. 111 (11) Elsevier BV**
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	*(2011, February) Ultramicroscopy* Vol. 111 (3) Elsevier BV**
	*(2011, March) Ultramicroscopy* Vol. 111 (4) Elsevier BV**
	*(2011, April) Ultramicroscopy* Vol. 111 (5) Elsevier BV**
	*(2011, May) Ultramicroscopy* Vol. 111 (6) Elsevier BV**
	*(2011, July) Ultramicroscopy* Vol. 111 (8) Elsevier BV**

(2011, June) Ultramicroscopy Vol. 111 (7) Elsevier BV

Contains

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