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Jiang, J., Britton, T.B., Wilkinson, A.J. (2013) Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size. Ultramicroscopy, 125. 1-9 doi:10.1016/j.ultramic.2012.11.003

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size
JournalUltramicroscopy
AuthorsJiang, J.Author
Britton, T.B.Author
Wilkinson, A.J.Author
Year2013 (February)Volume125
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2012.11.003Search in ResearchGate
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Mindat Ref. ID4907984Long-form Identifiermindat:1:5:4907984:5
GUID0
Full ReferenceJiang, J., Britton, T.B., Wilkinson, A.J. (2013) Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size. Ultramicroscopy, 125. 1-9 doi:10.1016/j.ultramic.2012.11.003
Plain TextJiang, J., Britton, T.B., Wilkinson, A.J. (2013) Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size. Ultramicroscopy, 125. 1-9 doi:10.1016/j.ultramic.2012.11.003
In(2013) Ultramicroscopy Vol. 125. Elsevier BV

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Britton, T.B., Wilkinson, A.J. (2011) Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction. Ultramicroscopy, 111 (8). 1395-1404 doi:10.1016/j.ultramic.2011.05.007
Wallis, David, Hansen, Lars N., Ben Britton, T., Wilkinson, Angus J. (2016) Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction. Ultramicroscopy, 168. 34-45 doi:10.1016/j.ultramic.2016.06.002
Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J. (2013) Assessing the precision of strain measurements using electron backscatter diffraction – part 1: Detector assessment. Ultramicroscopy, 135. 126-135 doi:10.1016/j.ultramic.2013.08.005
Britton, T.B., Wilkinson, A.J. (2012) High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. Ultramicroscopy, 114. 82-95 doi:10.1016/j.ultramic.2012.01.004
Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J. (2013) Assessing the precision of strain measurements using electron backscatter diffraction – Part 2: Experimental demonstration. Ultramicroscopy, 135. 136-141 doi:10.1016/j.ultramic.2013.08.006
Foden, A., Collins, D.M., Wilkinson, A.J., Britton, T.B. (2019) Indexing electron backscatter diffraction patterns with a refined template matching approach. Ultramicroscopy, 207. 112845pp. doi:10.1016/j.ultramic.2019.112845
Britton, T.B., Maurice, C., Fortunier, R., Driver, J.H., Day, A.P., Meaden, G., Dingley, D.J., Mingard, K., Wilkinson, A.J. (2010) Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy, 110 (12). 1443-1453 doi:10.1016/j.ultramic.2010.08.001
Ruggles, T.J., Fullwood, D.T. (2013) Estimations of bulk geometrically necessary dislocation density using high resolution EBSD. Ultramicroscopy, 133. 8-15 doi:10.1016/j.ultramic.2013.04.011
Tong, Vivian, Jiang, Jun, Wilkinson, Angus J., Britton, T. Ben (2015) The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy, 155. 62-73 doi:10.1016/j.ultramic.2015.04.019
Liang, X.Z., Dodge, M.F., Jiang, J., Dong, H.B. (2019) Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale. Ultramicroscopy, 197. 39-45 doi:10.1016/j.ultramic.2018.11.011
Wilkinson, Angus J., Meaden, Graham, Dingley, David J. (2006) High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy, 106 (4). 307-313 doi:10.1016/j.ultramic.2005.10.001
 
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