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(2013) Ultramicroscopy Vol. 131. Elsevier BV

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Reference TypeJournal (volume)
JournalUltramicroscopy
Year2013Volume<   131   >
PublisherElsevier BV
Mindat Ref. ID4908223Long-form Identifiermindat:1:5:4908223:8
GUID0
Full Reference(2013) Ultramicroscopy Vol. 131. Elsevier BV
Plain Text(2013) Ultramicroscopy Vol. 131. Elsevier BV
InElsevier BV (1975 - ) Ultramicroscopy

Contains

(2013) IFC (Editorial Board). Ultramicroscopy, 131. doi:10.1016/s0304-3991(13)00179-4
Mehrtens, Thorsten, MĂĽller, Knut, Schowalter, Marco, Hu, Dongzhi, Schaadt, Daniel M., Rosenauer, Andreas (2013) Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images. Ultramicroscopy, 131. 1-9 doi:10.1016/j.ultramic.2013.03.018
Béché, A., Rouvière, J.L., Barnes, J.P., Cooper, D. (2013) Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography. Ultramicroscopy, 131. 10-23 doi:10.1016/j.ultramic.2013.03.014
Genc, Arda, Kovarik, Libor, Gu, Meng, Cheng, Huikai, Plachinda, Paul, Pullan, Lee, Freitag, Bert, Wang, Chongmin (2013) XEDS STEM tomography for 3D chemical characterization of nanoscale particles. Ultramicroscopy, 131. 24-32 doi:10.1016/j.ultramic.2013.03.023
Alkorta, Jon (2013) Limits of simulation based high resolution EBSD. Ultramicroscopy, 131. 33-38 doi:10.1016/j.ultramic.2013.03.020
Löffler, S., Motsch, V., Schattschneider, P. (2013) A pure state decomposition approach of the mixed dynamic form factor for mapping atomic orbitals. Ultramicroscopy, 131. 39-45 doi:10.1016/j.ultramic.2013.03.021
Slattery, Ashley D., Blanch, Adam J., Quinton, Jamie S., Gibson, Christopher T. (2013) Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration. Ultramicroscopy, 131. 46-55 doi:10.1016/j.ultramic.2013.03.009
Pitters, Jason L., Urban, Radovan, Vesa, Cristian, Wolkow, Robert A. (2013) Tip apex shaping of gas field ion sources. Ultramicroscopy, 131. 56-60 doi:10.1016/j.ultramic.2013.03.013
Shigematsu, H., Sigworth, F.J. (2013) Noise models and cryo-EM drift correction with a direct-electron camera. Ultramicroscopy, 131. 61-69 doi:10.1016/j.ultramic.2013.04.001
Leary, Rowan, Saghi, Zineb, Midgley, Paul A., Holland, Daniel J. (2013) Compressed sensing electron tomography. Ultramicroscopy, 131. 70-91 doi:10.1016/j.ultramic.2013.03.019
Passian, Ali, Tetard, Laurene, Thundat, Thomas (2013) Comments on the paper “A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip-sample interaction forces” by Sohrab Eslami and Nader Jalili. Ultramicroscopy, 131. 92-93 doi:10.1016/j.ultramic.2013.03.016
Eslami, Sohrab, Jalili, Nader (2013) A response to the commentary on the paper “A comprehensive modeling and vibration analysis of AFM microcantilevers subjected to nonlinear tip–sample interaction forces” by Sohrab Eslami and Nader Jalili”. Ultramicroscopy, 131. 94-95 doi:10.1016/j.ultramic.2013.04.002

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