Reference Type | Journal (article/letter/editorial) |
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Title | Dielectric effect on electric fields in the vicinity of the metal–vacuum–dielectric junction |
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Journal | Ultramicroscopy |
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Authors | Chung, M.S. | Author |
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Mayer, A. | Author |
Miskovsky, N.M. | Author |
Weiss, B.L. | Author |
Cutler, P.H. | Author |
Year | 2013 (September) | Volume | 132 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.ultramic.2012.12.014Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 4908329 | Long-form Identifier | mindat:1:5:4908329:1 |
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GUID | 0 |
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Full Reference | Chung, M.S., Mayer, A., Miskovsky, N.M., Weiss, B.L., Cutler, P.H. (2013) Dielectric effect on electric fields in the vicinity of the metal–vacuum–dielectric junction. Ultramicroscopy, 132. 41-47 doi:10.1016/j.ultramic.2012.12.014 |
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Plain Text | Chung, M.S., Mayer, A., Miskovsky, N.M., Weiss, B.L., Cutler, P.H. (2013) Dielectric effect on electric fields in the vicinity of the metal–vacuum–dielectric junction. Ultramicroscopy, 132. 41-47 doi:10.1016/j.ultramic.2012.12.014 |
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In | (2013) Ultramicroscopy Vol. 132. Elsevier BV |
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