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Egerton, R.F. (2014) Choice of operating voltage for a transmission electron microscope. Ultramicroscopy, 145. 85-93 doi:10.1016/j.ultramic.2013.10.019

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Reference TypeJournal (article/letter/editorial)
TitleChoice of operating voltage for a transmission electron microscope
JournalUltramicroscopy
AuthorsEgerton, R.F.Author
Year2014 (October)Volume145
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2013.10.019Search in ResearchGate
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Mindat Ref. ID4908988Long-form Identifiermindat:1:5:4908988:8
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Full ReferenceEgerton, R.F. (2014) Choice of operating voltage for a transmission electron microscope. Ultramicroscopy, 145. 85-93 doi:10.1016/j.ultramic.2013.10.019
Plain TextEgerton, R.F. (2014) Choice of operating voltage for a transmission electron microscope. Ultramicroscopy, 145. 85-93 doi:10.1016/j.ultramic.2013.10.019
In(2014) Ultramicroscopy Vol. 145. Elsevier BV

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Egerton, R.F. (1978) A simple electron spectrometer for energy analysis in the transmission microscope. Ultramicroscopy, 3. 39-47 doi:10.1016/s0304-3991(78)80005-9
Inada, H., Su, D., Egerton, R.F., Konno, M., Wu, L., Ciston, J., Wall, J., Zhu, Y. (2011) Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms. Ultramicroscopy, 111 (7). 865-876 doi:10.1016/j.ultramic.2010.10.002
Wu, Lijun, Egerton, R.F., Zhu, Yimei (2012) Image simulation for atomic resolution secondary electron image. Ultramicroscopy, 123. 66-73 doi:10.1016/j.ultramic.2012.06.008
Egerton, R.F. (2012) TEM-EELS: A personal perspective. Ultramicroscopy, 119. 24-32 doi:10.1016/j.ultramic.2011.11.008
Egerton, R.F. (2007) Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy. Ultramicroscopy, 107 (8). 575-586 doi:10.1016/j.ultramic.2006.11.005
Egerton, R.F. (2021) Dose measurement in the TEM and STEM. Ultramicroscopy, 229. 113363pp. doi:10.1016/j.ultramic.2021.113363
Egerton, R.F. (2013) Control of radiation damage in the TEM. Ultramicroscopy, 127. 100-108 doi:10.1016/j.ultramic.2012.07.006
Lee, Z., Rose, H., Lehtinen, O., Biskupek, J., Kaiser, U. (2014) Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images. Ultramicroscopy, 145. 3-12 doi:10.1016/j.ultramic.2014.01.010
Drummy, Lawrence F. (2014) Electron microscopy of organic–inorganic interfaces: Advantages of low voltage. Ultramicroscopy, 145. 74-79 doi:10.1016/j.ultramic.2014.05.001
Dumaresq, Nicolas, Brodusch, Nicolas, Bessette, Stéphanie, Gauvin, Raynald (2024) Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS) Ultramicroscopy, 262. 113977 doi:10.1016/j.ultramic.2024.113977
Egerton, R.F. (2017) Scattering delocalization and radiation damage in STEM-EELS. Ultramicroscopy, 180. 115-124 doi:10.1016/j.ultramic.2017.02.007
 
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