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Woehl, Taylor, Keller, Robert (2016) Dark-field image contrast in transmission scanning electron microscopy: Effects of substrate thickness and detector collection angle. Ultramicroscopy, 171. 166-176 doi:10.1016/j.ultramic.2016.08.008

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Reference TypeJournal (article/letter/editorial)
TitleDark-field image contrast in transmission scanning electron microscopy: Effects of substrate thickness and detector collection angle
JournalUltramicroscopy
AuthorsWoehl, TaylorAuthor
Keller, RobertAuthor
Year2016 (December)Volume171
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2016.08.008Search in ResearchGate
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Mindat Ref. ID4910439Long-form Identifiermindat:1:5:4910439:0
GUID0
Full ReferenceWoehl, Taylor, Keller, Robert (2016) Dark-field image contrast in transmission scanning electron microscopy: Effects of substrate thickness and detector collection angle. Ultramicroscopy, 171. 166-176 doi:10.1016/j.ultramic.2016.08.008
Plain TextWoehl, Taylor, Keller, Robert (2016) Dark-field image contrast in transmission scanning electron microscopy: Effects of substrate thickness and detector collection angle. Ultramicroscopy, 171. 166-176 doi:10.1016/j.ultramic.2016.08.008
In(2016) Ultramicroscopy Vol. 171. Elsevier BV

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Woehl, Taylor J., White, Ryan M., Keller, Robert R. (2016) Dark-Field Scanning Transmission Ion Microscopy via Detection of Forward-Scattered Helium Ions with a Microchannel Plate. Microscopy and Microanalysis, 22 (3). 544-550 doi:10.1017/s1431927616000775
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Findlay, S.D., LeBeau, J.M. (2013) Detector non-uniformity in scanning transmission electron microscopy. Ultramicroscopy, 124. 52-60 doi:10.1016/j.ultramic.2012.09.001
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Kirk, T.L., De Pietro, L.G., Pescia, D., Ramsperger, U. (2009) Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy. Ultramicroscopy, 109 (5). 463-466 doi:10.1016/j.ultramic.2008.11.009
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