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Shi, Yushu, Li, Wei, Gao, Sitian, Lu, Mingzhen, Hu, Xiaodong (2018) Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling. Ultramicroscopy, 190. 77-80 doi:10.1016/j.ultramic.2018.03.020

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Reference TypeJournal (article/letter/editorial)
TitleAtomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling
JournalUltramicroscopy
AuthorsShi, YushuAuthor
Li, WeiAuthor
Gao, SitianAuthor
Lu, MingzhenAuthor
Hu, XiaodongAuthor
Year2018 (July)Volume190
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2018.03.020Search in ResearchGate
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Mindat Ref. ID4911761Long-form Identifiermindat:1:5:4911761:3
GUID0
Full ReferenceShi, Yushu, Li, Wei, Gao, Sitian, Lu, Mingzhen, Hu, Xiaodong (2018) Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling. Ultramicroscopy, 190. 77-80 doi:10.1016/j.ultramic.2018.03.020
Plain TextShi, Yushu, Li, Wei, Gao, Sitian, Lu, Mingzhen, Hu, Xiaodong (2018) Atomic force microscope scanning head with 3-dimensional orthogonal scanning to eliminate the curved coupling. Ultramicroscopy, 190. 77-80 doi:10.1016/j.ultramic.2018.03.020
In(2018) Ultramicroscopy Vol. 190. Elsevier BV

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Lu, Mingzhen, Gao, Sitian, Jin, Qihai, Cui, Jianjun, Du, Hua, Gao, Hongtang (2007) An atomic force microscope head designed for nanometrology. Measurement Science and Technology, 18. 1735-1739 doi:10.1088/0957-0233/18/6/s11
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