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Özgür Özer, H. (2019) Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy. Ultramicroscopy, 196. 54-57 doi:10.1016/j.ultramic.2018.09.018

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Reference TypeJournal (article/letter/editorial)
TitleAtomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy
JournalUltramicroscopy
AuthorsÖzgür Özer, H.Author
Year2019 (January)Volume196
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2018.09.018Search in ResearchGate
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Mindat Ref. ID4912105Long-form Identifiermindat:1:5:4912105:0
GUID0
Full ReferenceÖzgür Özer, H. (2019) Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy. Ultramicroscopy, 196. 54-57 doi:10.1016/j.ultramic.2018.09.018
Plain TextÖzgür Özer, H. (2019) Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy. Ultramicroscopy, 196. 54-57 doi:10.1016/j.ultramic.2018.09.018
In(2019) Ultramicroscopy Vol. 196. Elsevier BV

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Özer, H. Özgür, O’Brien, Simon J., Pethica, John B. (2007) Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy. Applied Physics Letters, 90 (13). 133110pp. doi:10.1063/1.2717115
Kim, Byung I., Boehm, Ryan D. (2013) Imaging stability in force-feedback high-speed atomic force microscopy. Ultramicroscopy, 125. 29-34 doi:10.1016/j.ultramic.2012.09.012
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Lu, Haojian, Wen, Yongbing, Zhang, Hao, Xie, Hui, Shen, Yajing (2019) 360° multiparametric imaging atomic force microscopy: A method for three-dimensional nanomechanical mapping. Ultramicroscopy, 196. 83-87 doi:10.1016/j.ultramic.2018.09.013
Luo, Yufan, Andersson, Sean B. (2019) A continuous sampling pattern design algorithm for atomic force microscopy images. Ultramicroscopy, 196. 167-179 doi:10.1016/j.ultramic.2018.10.013
Mahdavi, M.H., Farshidianfar, A., Tahani, M., Mahdavi, S., Dalir, H. (2008) A more comprehensive modeling of atomic force microscope cantilever. Ultramicroscopy, 109 (1). 54-60 doi:10.1016/j.ultramic.2008.08.003
Oral, A., Grimble, R. A., Özer, H. Ö., Pethica, J. B. (2003) High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy. Review of Scientific Instruments, 74 (8). 3656-3663 doi:10.1063/1.1593786
Slattery, Ashley D., Blanch, Adam J., Quinton, Jamie S., Gibson, Christopher T. (2013) Accurate measurement of Atomic Force Microscope cantilever deflection excluding tip-surface contact with application to force calibration. Ultramicroscopy, 131. 46-55 doi:10.1016/j.ultramic.2013.03.009
Berkels, Benjamin, Liebscher, Christian H. (2019) Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy. Ultramicroscopy, 198. 49-57 doi:10.1016/j.ultramic.2018.12.016
Balantekin, M. (2015) High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator. Ultramicroscopy, 149. 45-50 doi:10.1016/j.ultramic.2014.11.016
Hähner, Georg (2010) Dynamic spring constants for higher flexural modes of cantilever plates with applications to atomic force microscopy. Ultramicroscopy, 110 (7). 801-806 doi:10.1016/j.ultramic.2010.02.008
 
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