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Kerns, R.D., Balachandran, S., Hunter, A.H., Crimp, M.A. (2020) Ultra-high spatial resolution selected area electron channeling patterns. Ultramicroscopy, 210. 112915pp. doi:10.1016/j.ultramic.2019.112915

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Reference TypeJournal (article/letter/editorial)
TitleUltra-high spatial resolution selected area electron channeling patterns
JournalUltramicroscopy
AuthorsKerns, R.D.Author
Balachandran, S.Author
Hunter, A.H.Author
Crimp, M.A.Author
Year2020 (March)Volume210
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2019.112915Search in ResearchGate
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Mindat Ref. ID4912889Long-form Identifiermindat:1:5:4912889:5
GUID0
Full ReferenceKerns, R.D., Balachandran, S., Hunter, A.H., Crimp, M.A. (2020) Ultra-high spatial resolution selected area electron channeling patterns. Ultramicroscopy, 210. 112915pp. doi:10.1016/j.ultramic.2019.112915
Plain TextKerns, R.D., Balachandran, S., Hunter, A.H., Crimp, M.A. (2020) Ultra-high spatial resolution selected area electron channeling patterns. Ultramicroscopy, 210. 112915pp. doi:10.1016/j.ultramic.2019.112915
In(2020) Ultramicroscopy Vol. 210. Elsevier BV

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Kerns, R.D., Balachandran, S., Hunter, A.H., Crimp, M.A. (2017) Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope. Microscopy and Microanalysis, 23. 548-549 doi:10.1017/s1431927617003427
Guyon, J., Mansour, H., Gey, N., Crimp, M.A., Chalal, S., Maloufi, N. (2015) Sub-micron resolution selected area electron channeling patterns. Ultramicroscopy, 149. 34-44 doi:10.1016/j.ultramic.2014.11.004
Ruggles, T.J., Yoo, Y.S.J., Dunlap, B.E., Crimp, M.A., Kacher, J. (2020) Correlating results from high resolution EBSD with TEM- and ECCI-based dislocation microscopy: Approaching single dislocation sensitivity via noise reduction. Ultramicroscopy, 210. 112927pp. doi:10.1016/j.ultramic.2019.112927
Simkin, B.A, Crimp, M.A (1999) An experimentally convenient configuration for electron channeling contrast imaging. Ultramicroscopy, 77 (1). 65-75 doi:10.1016/s0304-3991(99)00009-1
Barnard, Jonathan S., Johnstone, Duncan N., Midgley, Paul A. (2017) High-resolution scanning precession electron diffraction: Alignment and spatial resolution. Ultramicroscopy, 174. 79-88 doi:10.1016/j.ultramic.2016.12.018
Balachandran, S., Radha, Z., Colbry, D., Crimp, M.A. (2017) Focused Ion Beam (FIB) based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI). Microscopy and Microanalysis, 23. 572-573 doi:10.1017/s1431927617003543
Zaefferer, S. (2007) On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns. Ultramicroscopy, 107 (2). 254-266 doi:10.1016/j.ultramic.2006.08.007
Dunlap, Bret E., Ruggles, Timothy J., Fullwood, David T., Jackson, Brian, Crimp, Martin A. (2018) Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction. Ultramicroscopy, 184. 125-133 doi:10.1016/j.ultramic.2017.08.017
Morishita, Shigeyuki, Yamasaki, Jun, Tanaka, Nobuo (2013) Measurement of spatial coherence of electron beams by using a small selected-area aperture. Ultramicroscopy, 129. 10-17 doi:10.1016/j.ultramic.2013.02.019
Mitchell, D.R.G., Van den Berg, J.A. (2016) Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns. Ultramicroscopy, 160. 140-145 doi:10.1016/j.ultramic.2015.10.009
Mitchell, D.R.G. (2008) Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital Micrographâ„¢. Ultramicroscopy, 108 (4). 367-374 doi:10.1016/j.ultramic.2007.06.003
 
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