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Frankl, D. R. (1963) Transmission Electron Microscopy of Cleaved Silicon. Journal of Applied Physics, 34 (12). 3514-3516 doi:10.1063/1.1729250

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Reference TypeJournal (article/letter/editorial)
TitleTransmission Electron Microscopy of Cleaved Silicon
JournalJournal of Applied Physics
AuthorsFrankl, D. R.Author
Year1963 (December)Volume34
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.1729250Search in ResearchGate
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Mindat Ref. ID4927449Long-form Identifiermindat:1:5:4927449:5
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Full ReferenceFrankl, D. R. (1963) Transmission Electron Microscopy of Cleaved Silicon. Journal of Applied Physics, 34 (12). 3514-3516 doi:10.1063/1.1729250
Plain TextFrankl, D. R. (1963) Transmission Electron Microscopy of Cleaved Silicon. Journal of Applied Physics, 34 (12). 3514-3516 doi:10.1063/1.1729250
In(1963, December) Journal of Applied Physics Vol. 34 (12) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Frankl, D. R. (1964) Electron Extinction Distance in Silicon. Journal of Applied Physics, 35 (1). 217-219 doi:10.1063/1.1713073
Frankl, D. R. (1963) Power and Efficiency Considerations in Continuous Laser Operation. Journal of Applied Physics, 34 (3). 459-462 doi:10.1063/1.1729294
Hennig, G. R. (1963) Electron Microscopy of Graphite Containing Boron. Journal of Applied Physics, 34 (1). 237-238 doi:10.1063/1.1729080
Whetten, N. Rey (1963) Secondary Electron Emission of Pyrolytic Graphite Cleaved in a High Vacuum. Journal of Applied Physics, 34 (4). 771-773 doi:10.1063/1.1729532
Lander, J. J., Gobeli, G. W., Morrison, J. (1963) Structural Properties of Cleaved Silicon and Germanium Surfaces. Journal of Applied Physics, 34 (8). 2298-2306 doi:10.1063/1.1702734
Haneman, D., Pugh, E. N. (1963) Tear Marks on Cleaved Germanium Surfaces. Journal of Applied Physics, 34 (8). 2269-2272 doi:10.1063/1.1702727
Blank, H., Amelinckx, S. (1963) Some Preliminary Results on Defects in Irradiated UO2 Single Crystals as Revealed by Transmission Electron Microscopy. Journal of Applied Physics, 34 (8). 2200-2209 doi:10.1063/1.1702714
Bhatnagar, A. K., Prasad, B. Bhanu, Jagannathan, R. (1985) Studies on glassy ferromagnet Fe67Co18B14Si1. Journal of Applied Physics, 57 (8). 3514-3516 doi:10.1063/1.335045
Robinson, D. L. (1958) Revealing Dislocation Sites in Aluminum by Transmission Electron Microscopy. Journal of Applied Physics, 29 (12). 1635-1639 doi:10.1063/1.1723015
McAlister, D. W., McCann, P. J., Namjou, K., Fang, X. M., Alkhouli, O., Wu, H. Z. (2001) Midinfrared photoluminescence from IV–VI semiconductors grown on silicon. Journal of Applied Physics, 89 (6). 3514-3516 doi:10.1063/1.1347950
Chuang, S.‐F., Collins, S. D., Smith, R. L. (1989) Porous silicon microstructure as studied by transmission electron microscopy. Applied Physics Letters, 55 (15). 1540-1542 doi:10.1063/1.102239
 
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