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Lander, J. J., Morrison, J. (1963) Scattering Factors and Other Properties of Low‐Energy Electron Diffraction. Journal of Applied Physics, 34 (12). 3517-3535 doi:10.1063/1.1729251

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Reference TypeJournal (article/letter/editorial)
TitleScattering Factors and Other Properties of Low‐Energy Electron Diffraction
JournalJournal of Applied Physics
AuthorsLander, J. J.Author
Morrison, J.Author
Year1963 (December)Volume34
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.1729251Search in ResearchGate
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Mindat Ref. ID4927452Long-form Identifiermindat:1:5:4927452:9
GUID0
Full ReferenceLander, J. J., Morrison, J. (1963) Scattering Factors and Other Properties of Low‐Energy Electron Diffraction. Journal of Applied Physics, 34 (12). 3517-3535 doi:10.1063/1.1729251
Plain TextLander, J. J., Morrison, J. (1963) Scattering Factors and Other Properties of Low‐Energy Electron Diffraction. Journal of Applied Physics, 34 (12). 3517-3535 doi:10.1063/1.1729251
In(1963, December) Journal of Applied Physics Vol. 34 (12) AIP Publishing

See Also

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Lander, J. J., Morrison, J. (1963) Low‐Energy Electron‐Diffraction Study of the Surface Reactions of Germanium with Oxygen and with Iodine. II. Journal of Applied Physics, 34 (5). 1411-1415 doi:10.1063/1.1729591
Lander, J. J., Morrison, J. (1964) Low‐Energy Electron Diffraction Study of Graphite. Journal of Applied Physics, 35 (12). 3593-3598 doi:10.1063/1.1713277
Lander, J. J., Morrison, J. (1962) Low‐Energy Electron Diffraction Study of Silicon Surface Structures. The Journal of Chemical Physics, 37 (4) 729-746 doi:10.1063/1.1733155
Lander, J. J., Morrison, J. (1962) Low Voltage Electron Diffraction Study of the Oxidation and Reduction of Silicon. Journal of Applied Physics, 33 (6). 2089-2092 doi:10.1063/1.1728901
Lander, J. J., Gobeli, G. W., Morrison, J. (1963) Structural Properties of Cleaved Silicon and Germanium Surfaces. Journal of Applied Physics, 34 (8). 2298-2306 doi:10.1063/1.1702734
Gobeli, G. W., Lander, J. J., Morrison, J. (1966) Low‐Energy Electron Diffraction Study of the Adsorption of Cesium on the (111) Surface of Si. Journal of Applied Physics, 37 (1). 203-206 doi:10.1063/1.1707808
Lander, J. J., Morrison, J. (1963) Structures of Clean Surfaces of Germanium and Silicon. I. Journal of Applied Physics, 34 (5). 1403-1410 doi:10.1063/1.1729590
Lander, J. J., Morrison, J., Unterwald, F. (1962) Improved Design and Method of Operation of Low Energy Electron Diffraction Equipment. Review of Scientific Instruments, 33 (7). 782-783 doi:10.1063/1.1717975
Lander, J. J., Morrison, J. (2006) LOW ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES. Annals of the New York Academy of Sciences, 101 (3) 605-626 doi:10.1111/j.1749-6632.1963.tb54918.x
Lander, J.J., Morrison, J. (1966) Low energy electron diffraction study of the (111) diamond surface. Surface Science, 4 (3). 241-246 doi:10.1016/0039-6028(66)90004-5
Lander, J. J. (1948) Use of an Electron Diffraction Camera as an Ultraoscilloscope, and Suggested Application to Contact Erosion. Journal of Applied Physics, 19 (12). 1128-1129 doi:10.1063/1.1715029
 
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