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Rice, Katherine P., Keller, Robert R., Stoykovich, Mark P. (2015) Beam Broadening in Transmission EBSD. Microscopy Today, 23 (2). 32-37 doi:10.1017/s1551929515000048

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Reference TypeJournal (article/letter/editorial)
TitleBeam Broadening in Transmission EBSD
JournalMicroscopy Today
AuthorsRice, Katherine P.Author
Keller, Robert R.Author
Stoykovich, Mark P.Author
Year2015 (March)Volume23
Issue2
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1551929515000048Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4975003Long-form Identifiermindat:1:5:4975003:8
GUID0
Full ReferenceRice, Katherine P., Keller, Robert R., Stoykovich, Mark P. (2015) Beam Broadening in Transmission EBSD. Microscopy Today, 23 (2). 32-37 doi:10.1017/s1551929515000048
Plain TextRice, Katherine P., Keller, Robert R., Stoykovich, Mark P. (2015) Beam Broadening in Transmission EBSD. Microscopy Today, 23 (2). 32-37 doi:10.1017/s1551929515000048
In(2015, March) Microscopy Today Vol. 23 (2) Cambridge University Press (CUP)

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Rice, Katherine P., Keller, Robert R. (2014) Thickness-Dependent Beam Broadening in Transmission EBSD. Microscopy and Microanalysis, 20. 854-855 doi:10.1017/s1431927614005996
Geiss, Roy H., Rice, Katherine P., Keller, Robert R. (2013) Transmission EBSD in the Scanning Electron Microscope. Microscopy Today, 21 (3). 16-20 doi:10.1017/s1551929513000503
Rice, Katherine P., Chen, Yimeng, Prosa, Ty J., Larson, David J., Nowell, Matt, Stoykovich, Mark P. (2015) Techniques for Transmission EBSD Mapping of Atom Probe Specimens. Microscopy and Microanalysis, 21. 1677-1678 doi:10.1017/s1431927615009162
Keller, Robert R. (2017) 2015 NIST Workshop on Analytical Transmission Scanning Electron Microscopy. Microscopy and Microanalysis, 23. 598-599 doi:10.1017/s1431927617003671
Sanders, Mark A., Chair, Program (2015) Microscopy & Microanalysis 2015 in Portland. Microscopy Today, 23 (1). 34-37 doi:10.1017/s1551929514001357
Holm, Jason, Keller, Robert R. (2017) Acceptance Angle Control for Improved Transmission Imaging in an SEM. Microscopy Today, 25 (2). 12-19 doi:10.1017/s1551929516001267
Schwarzer, Robert A., Hjelen, Jarle (2015) Backscattered Electron Imaging with an EBSD Detector. Microscopy Today, 23 (1). 12-17 doi:10.1017/s1551929514001333
Rice, Katherine P., Han, Junsu, Campbell, Ian P., Stoykovich, Mark P. (2015) In situ Absorbance Spectroscopy for Characterizing the Low Temperature Oxidation Kinetics of Sputtered Copper Films. Oxidation of Metals, 83. 89-99 doi:10.1007/s11085-014-9508-1
Geiss, R, Keller, R, Sitzman, S, Rice, P (2011) New Method of Transmission Electron Diffraction to Characterize Nanomaterials in the SEM. Microscopy and Microanalysis, 17. 386-387 doi:10.1017/s1431927611002807
RICE, K.P., KELLER, R.R., STOYKOVICH, M.P. (2014) Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope. Journal of Microscopy, 254 (3). 129-136 doi:10.1111/jmi.12124
Greene, Jennifer E. (2015) Quantitative Electrical Measurements with Atomic Force Microscopy. Microscopy Today, 23 (6). 32-37 doi:10.1017/s1551929515000991
 
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