Reference Type | Journal (article/letter/editorial) |
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Title | The role of Ga antisite defect in the activation process of transmuted impurities in neutron‐transmutation‐doped semi‐insulating GaAs |
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Journal | Journal of Applied Physics |
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Authors | Satoh, M. | Author |
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Yokoyama, K. | Author |
Kuriyama, K. | Author |
Year | 1990 (July) | Volume | 68 |
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Issue | 1 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.347145Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5047046 | Long-form Identifier | mindat:1:5:5047046:6 |
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GUID | 0 |
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Full Reference | Satoh, M., Yokoyama, K., Kuriyama, K. (1990) The role of Ga antisite defect in the activation process of transmuted impurities in neutron‐transmutation‐doped semi‐insulating GaAs. Journal of Applied Physics, 68 (1). 363-366 doi:10.1063/1.347145 |
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Plain Text | Satoh, M., Yokoyama, K., Kuriyama, K. (1990) The role of Ga antisite defect in the activation process of transmuted impurities in neutron‐transmutation‐doped semi‐insulating GaAs. Journal of Applied Physics, 68 (1). 363-366 doi:10.1063/1.347145 |
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In | (1990, July) Journal of Applied Physics Vol. 68 (1) AIP Publishing |
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