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Kanata, T., Matsunaga, M., Takakura, H., Hamakawa, Y., Nishino, T. (1990) Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100). Journal of Applied Physics, 68 (10). 5309-5313 doi:10.1063/1.347023

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Reference TypeJournal (article/letter/editorial)
TitlePhotoreflectance characterization of surface Fermi level in as‐grown GaAs(100)
JournalJournal of Applied Physics
AuthorsKanata, T.Author
Matsunaga, M.Author
Takakura, H.Author
Hamakawa, Y.Author
Nishino, T.Author
Year1990 (November 15)Volume68
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.347023Search in ResearchGate
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Mindat Ref. ID5047087Long-form Identifiermindat:1:5:5047087:3
GUID0
Full ReferenceKanata, T., Matsunaga, M., Takakura, H., Hamakawa, Y., Nishino, T. (1990) Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100). Journal of Applied Physics, 68 (10). 5309-5313 doi:10.1063/1.347023
Plain TextKanata, T., Matsunaga, M., Takakura, H., Hamakawa, Y., Nishino, T. (1990) Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100). Journal of Applied Physics, 68 (10). 5309-5313 doi:10.1063/1.347023
In(1990, November) Journal of Applied Physics Vol. 68 (10) AIP Publishing


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