Reference Type | Journal (article/letter/editorial) |
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Title | Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100) |
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Journal | Journal of Applied Physics |
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Authors | Kanata, T. | Author |
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Matsunaga, M. | Author |
Takakura, H. | Author |
Hamakawa, Y. | Author |
Nishino, T. | Author |
Year | 1990 (November 15) | Volume | 68 |
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Issue | 10 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.347023Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5047087 | Long-form Identifier | mindat:1:5:5047087:3 |
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GUID | 0 |
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Full Reference | Kanata, T., Matsunaga, M., Takakura, H., Hamakawa, Y., Nishino, T. (1990) Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100). Journal of Applied Physics, 68 (10). 5309-5313 doi:10.1063/1.347023 |
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Plain Text | Kanata, T., Matsunaga, M., Takakura, H., Hamakawa, Y., Nishino, T. (1990) Photoreflectance characterization of surface Fermi level in as‐grown GaAs(100). Journal of Applied Physics, 68 (10). 5309-5313 doi:10.1063/1.347023 |
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In | (1990, November) Journal of Applied Physics Vol. 68 (10) AIP Publishing |
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