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Chen, L. J., Thomas, G. (1974) Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopy. physica status solidi (a), 25 (1). 193-204 doi:10.1002/pssa.2210250117

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Reference TypeJournal (article/letter/editorial)
TitleApplications of many beam systematic diffraction contrast in high voltage transmission electron microscopy
Journalphysica status solidi (a)
AuthorsChen, L. J.Author
Thomas, G.Author
Year1974 (September 16)Volume25
Issue1
PublisherWiley
DOIdoi:10.1002/pssa.2210250117Search in ResearchGate
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Mindat Ref. ID5048939Long-form Identifiermindat:1:5:5048939:4
GUID0
Full ReferenceChen, L. J., Thomas, G. (1974) Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopy. physica status solidi (a), 25 (1). 193-204 doi:10.1002/pssa.2210250117
Plain TextChen, L. J., Thomas, G. (1974) Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopy. physica status solidi (a), 25 (1). 193-204 doi:10.1002/pssa.2210250117
In(1974, September) physica status solidi (a) Vol. 25 (1) Wiley

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Chen, L. J., Seshan, K., Thomas, G. (1975) Contrast and resolution of small dislocation loops in high-voltage electron microscopy. physica status solidi (a), 28 (1). 309-319 doi:10.1002/pssa.2210280136
Salisbury, I. G. (1981) Comments on weak-beam contrast of stacking faults in transmission electron microscopy /1/. physica status solidi (a), 66 (1). doi:10.1002/pssa.2210660164
Sandström, R., Melander, A., Eriksson, L. (1974) Influence of non-systematic reflexions on weak-beam and high-resolution bright-field images in high-voltage electron microscopy. physica status solidi (a), 26 (1). 273-284 doi:10.1002/pssa.2210260128
Salisbury, I. G. (1982) On the Effect of Lattice Dilatation upon Weak-Beam Contrast from Stacking Faults in Transmission Electron Microscopy. physica status solidi (a), 73 (1). doi:10.1002/pssa.2210730139
Jones, I. P. (1978) Systematic electron diffraction by H.C.P. metals. I. Theory and main beam transmission. physica status solidi (a), 47 (1). 163-178 doi:10.1002/pssa.2210470118
Föll, H., Carter, C. B., Wilkens, M. (1980) Weak-beam contrast of stacking faults in transmission electron microscopy. physica status solidi (a), 58 (2). 393-407 doi:10.1002/pssa.2210580210
Kästner, G. (1988) Approximations to the Systematic Many-Beam Case of High-Energy Electron Diffraction. I. Transition from Two-Beam to Many-Beam Interaction. physica status solidi (b), 145 (2). 373-390 doi:10.1002/pssb.2221450203
Malicskó, L., Scholz, R. (1983) Microtwins in LiNbO3 crystals observed by high-voltage and high-resolution electron microscopy. physica status solidi (a), 78 (1). doi:10.1002/pssa.2210780142
Kelly, P. M., Blake, R. G. (1974) The determination of dislocation loop plane normals by transmission electron microscopy. physica status solidi (a), 25 (2). 599-605 doi:10.1002/pssa.2210250229
Berezhkova, G. V., Gerasimov, Yu. M., Govorkov, V. G., Kozlovskaya, E. P. (1974) High voltage electron microscopy of corundum single crystals. physica status solidi (a), 21 (2). doi:10.1002/pssa.2210210246
Bauer, H.-D., Thomas, J., Wetzig, K. (1995) Analytical transmission electron microscopy in materials research. physica status solidi (a), 150 (1). 141-152 doi:10.1002/pssa.2211500112
 
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