Reference Type | Journal (article/letter/editorial) |
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Title | Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition |
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Journal | Journal of Applied Physics |
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Authors | Cillessen, J. F. M. | Author |
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Prins, M. W. J. | Author |
Wolf, R. M. | Author |
Year | 1997 (March 15) | Volume | 81 |
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Issue | 6 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.363961Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5084920 | Long-form Identifier | mindat:1:5:5084920:4 |
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GUID | 0 |
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Full Reference | Cillessen, J. F. M., Prins, M. W. J., Wolf, R. M. (1997) Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition. Journal of Applied Physics, 81 (6). 2777-2783 doi:10.1063/1.363961 |
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Plain Text | Cillessen, J. F. M., Prins, M. W. J., Wolf, R. M. (1997) Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition. Journal of Applied Physics, 81 (6). 2777-2783 doi:10.1063/1.363961 |
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In | (1997, March) Journal of Applied Physics Vol. 81 (6) AIP Publishing |
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