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Lallet, François, Dauger, Alain, Olivi-Tran, Nathalie (2007) Comparison between models of insulator and semiconductor thin films islanding. physica status solidi (c), 4 (3). 1189-1192 doi:10.1002/pssc.200673714

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Reference TypeJournal (article/letter/editorial)
TitleComparison between models of insulator and semiconductor thin films islanding
Journalphysica status solidi (c)
AuthorsLallet, FrançoisAuthor
Dauger, AlainAuthor
Olivi-Tran, NathalieAuthor
Year2007 (March)Volume4
Issue3
PublisherWiley
DOIdoi:10.1002/pssc.200673714Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5113846Long-form Identifiermindat:1:5:5113846:0
GUID0
Full ReferenceLallet, François, Dauger, Alain, Olivi-Tran, Nathalie (2007) Comparison between models of insulator and semiconductor thin films islanding. physica status solidi (c), 4 (3). 1189-1192 doi:10.1002/pssc.200673714
Plain TextLallet, François, Dauger, Alain, Olivi-Tran, Nathalie (2007) Comparison between models of insulator and semiconductor thin films islanding. physica status solidi (c), 4 (3). 1189-1192 doi:10.1002/pssc.200673714
In(2007, March) physica status solidi (c) Vol. 4 (3) Wiley

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