Reference Type | Journal (article/letter/editorial) |
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Title | Hydrogen-defect complexes formed by neutron irradiation of hydrogenated silicon observed by optical absorption measurement |
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Journal | Journal of Applied Physics |
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Authors | Fukata, N. | Author |
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Ohori, T. | Author |
Suezawa, M. | Author |
Takahashi, H. | Author |
Year | 2002 (May) | Volume | 91 |
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Issue | 9 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1468910Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5114954 | Long-form Identifier | mindat:1:5:5114954:5 |
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GUID | 0 |
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Full Reference | Fukata, N., Ohori, T., Suezawa, M., Takahashi, H. (2002) Hydrogen-defect complexes formed by neutron irradiation of hydrogenated silicon observed by optical absorption measurement. Journal of Applied Physics, 91 (9). 5831-5839 doi:10.1063/1.1468910 |
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Plain Text | Fukata, N., Ohori, T., Suezawa, M., Takahashi, H. (2002) Hydrogen-defect complexes formed by neutron irradiation of hydrogenated silicon observed by optical absorption measurement. Journal of Applied Physics, 91 (9). 5831-5839 doi:10.1063/1.1468910 |
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In | (2002, May) Journal of Applied Physics Vol. 91 (9) AIP Publishing |
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