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Croft, M., Zakharchenko, I., Zhong, Z., Gurlak, Y., Hastings, J., Hu, J., Holtz, R., DaSilva, M., Tsakalakos, T. (2002) Strain field and scattered intensity profiling with energy dispersive x-ray scattering. Journal of Applied Physics, 92 (1). 578-586 doi:10.1063/1.1483373

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Reference TypeJournal (article/letter/editorial)
TitleStrain field and scattered intensity profiling with energy dispersive x-ray scattering
JournalJournal of Applied Physics
AuthorsCroft, M.Author
Zakharchenko, I.Author
Zhong, Z.Author
Gurlak, Y.Author
Hastings, J.Author
Hu, J.Author
Holtz, R.Author
DaSilva, M.Author
Tsakalakos, T.Author
Year2002 (July)Volume92
Issue1
PublisherAIP Publishing
DOIdoi:10.1063/1.1483373Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5115089Long-form Identifiermindat:1:5:5115089:7
GUID0
Full ReferenceCroft, M., Zakharchenko, I., Zhong, Z., Gurlak, Y., Hastings, J., Hu, J., Holtz, R., DaSilva, M., Tsakalakos, T. (2002) Strain field and scattered intensity profiling with energy dispersive x-ray scattering. Journal of Applied Physics, 92 (1). 578-586 doi:10.1063/1.1483373
Plain TextCroft, M., Zakharchenko, I., Zhong, Z., Gurlak, Y., Hastings, J., Hu, J., Holtz, R., DaSilva, M., Tsakalakos, T. (2002) Strain field and scattered intensity profiling with energy dispersive x-ray scattering. Journal of Applied Physics, 92 (1). 578-586 doi:10.1063/1.1483373
In(2002, July) Journal of Applied Physics Vol. 92 (1) AIP Publishing

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