Hsueh, Chun-Hway (2002) Modeling of thermal stresses in passivated interconnects. Journal of Applied Physics, 92 (1). 144-153 doi:10.1063/1.1483382
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Modeling of thermal stresses in passivated interconnects | ||
Journal | Journal of Applied Physics | ||
Authors | Hsueh, Chun-Hway | Author | |
Year | 2002 (July) | Volume | 92 |
Issue | 1 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1483382Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5115095 | Long-form Identifier | mindat:1:5:5115095:8 |
GUID | 0 | ||
Full Reference | Hsueh, Chun-Hway (2002) Modeling of thermal stresses in passivated interconnects. Journal of Applied Physics, 92 (1). 144-153 doi:10.1063/1.1483382 | ||
Plain Text | Hsueh, Chun-Hway (2002) Modeling of thermal stresses in passivated interconnects. Journal of Applied Physics, 92 (1). 144-153 doi:10.1063/1.1483382 | ||
In | (2002, July) Journal of Applied Physics Vol. 92 (1) AIP Publishing |
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