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Kumagai, N., Hanada, T., Yao, T., Yasuda, T. (2002) Determination of carrier concentration in n-ZnSe by reflectance difference spectroscopy: Experimental results and model calculation. Journal of Applied Physics, 92 (1). 139-143 doi:10.1063/1.1483917

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Reference TypeJournal (article/letter/editorial)
TitleDetermination of carrier concentration in n-ZnSe by reflectance difference spectroscopy: Experimental results and model calculation
JournalJournal of Applied Physics
AuthorsKumagai, N.Author
Hanada, T.Author
Yao, T.Author
Yasuda, T.Author
Year2002 (July)Volume92
Issue1
PublisherAIP Publishing
DOIdoi:10.1063/1.1483917Search in ResearchGate
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Mindat Ref. ID5115110Long-form Identifiermindat:1:5:5115110:6
GUID0
Full ReferenceKumagai, N., Hanada, T., Yao, T., Yasuda, T. (2002) Determination of carrier concentration in n-ZnSe by reflectance difference spectroscopy: Experimental results and model calculation. Journal of Applied Physics, 92 (1). 139-143 doi:10.1063/1.1483917
Plain TextKumagai, N., Hanada, T., Yao, T., Yasuda, T. (2002) Determination of carrier concentration in n-ZnSe by reflectance difference spectroscopy: Experimental results and model calculation. Journal of Applied Physics, 92 (1). 139-143 doi:10.1063/1.1483917
In(2002, July) Journal of Applied Physics Vol. 92 (1) AIP Publishing

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Kumagai, N, Yasuda, T, Hanada, T, Yao, T (2000) In situ measurement of carrier concentration in n-ZnSe by reflectance difference spectroscopy (RDS). Journal of Crystal Growth, 214. 547-551 doi:10.1016/s0022-0248(00)00149-4
Kumagai, N., Jung, H.D., Hanada, T., Zhu, Z., Yasuda, T., Kimura, K., Lee, S.D., Jeon, M.H., Park, H.S., Kim, T.I., Yao, T. (1998) Non-destructive measurement of electron concentration in n-ZnSe by means of reflectance difference spectroscopy. Journal of Crystal Growth, 184. 505-509 doi:10.1016/s0022-0248(98)80105-x
Jung, H. D., Kumagai, N., Hanada, T., Zhu, Z., Yao, T., Yasuda, T., Kimura, K. (1997) In situreflectance difference spectroscopy and reflection high-energy electron diffraction observation of nitridation processes on GaAs(001) surfaces. Journal of Applied Physics, 82 (9). 4684-4686 doi:10.1063/1.366209
Jung, H.D., Kumagai, N., Hanada, T., Kurtz, E., Zhu, Z., Yao, T. (1998) Investigation of the surfactant effect of Sn in ZnSe by reflectance difference spectroscopy and reflection high-energy electron diffraction. Journal of Crystal Growth, 184. 223-227 doi:10.1016/s0022-0248(98)80049-3
Mori, Takahiro, Kumagai, Naoto, Hanada, Takashi, Yao, Takafumi, Yasuda, Tetsuji (2003) Measurements of a component of the piezo-optic tensor of Si by reflectance difference spectroscopy. Journal of Applied Physics, 94 (3). 1458-1460 doi:10.1063/1.1586965
Jung, H. D., Kumagai, N., Hanada, T., Zhu, Z., Yao, T., Yasuda, T., Kimura, K. (1998) Nitridation processes on GaAs(001) surfaces: Optical, structural, and chemical analysis. Journal of Applied Physics, 83 (10). 5497-5503 doi:10.1063/1.367409
Kumagai, N (1998) Non-destructive measurement of electron concentration in n-ZnSe by means of reflectance difference spectroscopy. Journal of Crystal Growth, 184 (1). 505-509 doi:10.1016/s0022-0248(97)00738-0
Mori, T., Kumagai, N., Yasuda, T., Takai, T., Chang, J.H., Hanada, T., Yao, T. (2002) Measurements of the Linear Electro-Optic Coefficients of ZnTe by RDS. physica status solidi (b), 229 (1). 605-609 doi:10.1002/1521-3951(200201)229:1<605::aid-pssb605>3.0.co;2-s
Jin, Cheng-Guo, Yasuda, Tetsuji, Kimura, Kozo, Ohtake, Akihiro, Kuo, Li-Hsin, Wang, Tai-Hong, Miwa, Shiro, Yao, Takafumi, Tanaka, Kazunobu (1997) Non-Contact and Non-Destructive Measurement of Carrier Concentration of Nitrogen-Doped ZnSe by Reflectance Difference Spectroscopy. Japanese Journal of Applied Physics, 36. 6638-6644 doi:10.1143/jjap.36.6638
Ulyanenkov, A., Takase, A., Kuribayashi, M., Ishida, K., Ohtake, A., Arai, K., Hanada, T., Yasuda, T., Yao, T., Tomita, H., Komiya, S. (1999) X-ray reflectivity from ZnSe/GaAs heterostructures. Journal of Applied Physics, 85 (3). 1520-1523 doi:10.1063/1.369281
Godo, K., Chang, J. H., Makino, H., Takai, T., Hanada, T., Yao, T., Sasao, T., Goto, T. (2002) Formation processes of CdTe quantum dots on ZnTe substrates studied by reflection high-energy electron diffraction and photoluminescence. Journal of Applied Physics, 92 (9). 5490-5493 doi:10.1063/1.1513888
 
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