Reference Type | Journal (article/letter/editorial) |
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Title | Effects of buffer layer thickness and strain on the dielectric properties of epitaxial SrTiO3 thin films |
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Journal | Journal of Applied Physics |
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Authors | James, A. R. | Author |
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Xi, X. X. | Author |
Year | 2002 (November 15) | Volume | 92 |
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Issue | 10 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1515100Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5115312 | Long-form Identifier | mindat:1:5:5115312:2 |
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GUID | 0 |
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Full Reference | James, A. R., Xi, X. X. (2002) Effects of buffer layer thickness and strain on the dielectric properties of epitaxial SrTiO3 thin films. Journal of Applied Physics, 92 (10). 6149-6152 doi:10.1063/1.1515100 |
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Plain Text | James, A. R., Xi, X. X. (2002) Effects of buffer layer thickness and strain on the dielectric properties of epitaxial SrTiO3 thin films. Journal of Applied Physics, 92 (10). 6149-6152 doi:10.1063/1.1515100 |
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In | (2002, November) Journal of Applied Physics Vol. 92 (10) AIP Publishing |
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