Ge, Jia, Ling, Zhi Peng, Wong, Johnson, Stangl, Rolf, Aberle, Armin G., Mueller, Thomas (2013) Analysis of intrinsic hydrogenated amorphous silicon passivation layer growth for use in heterojunction silicon wafer solar cells by optical emission spectroscopy. Journal of Applied Physics, 113 (23). 234310pp. doi:10.1063/1.4810900
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Analysis of intrinsic hydrogenated amorphous silicon passivation layer growth for use in heterojunction silicon wafer solar cells by optical emission spectroscopy | ||
Journal | Journal of Applied Physics | ||
Authors | Ge, Jia | Author | |
Ling, Zhi Peng | Author | ||
Wong, Johnson | Author | ||
Stangl, Rolf | Author | ||
Aberle, Armin G. | Author | ||
Mueller, Thomas | Author | ||
Year | 2013 (June 21) | Volume | 113 |
Issue | 23 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.4810900Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5193241 | Long-form Identifier | mindat:1:5:5193241:3 |
GUID | 0 | ||
Full Reference | Ge, Jia, Ling, Zhi Peng, Wong, Johnson, Stangl, Rolf, Aberle, Armin G., Mueller, Thomas (2013) Analysis of intrinsic hydrogenated amorphous silicon passivation layer growth for use in heterojunction silicon wafer solar cells by optical emission spectroscopy. Journal of Applied Physics, 113 (23). 234310pp. doi:10.1063/1.4810900 | ||
Plain Text | Ge, Jia, Ling, Zhi Peng, Wong, Johnson, Stangl, Rolf, Aberle, Armin G., Mueller, Thomas (2013) Analysis of intrinsic hydrogenated amorphous silicon passivation layer growth for use in heterojunction silicon wafer solar cells by optical emission spectroscopy. Journal of Applied Physics, 113 (23). 234310pp. doi:10.1063/1.4810900 | ||
In | (2013, June) Journal of Applied Physics Vol. 113 (23) AIP Publishing |
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