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Evans, J., Chapman, S. (2014) Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope. Journal of Applied Physics, 116 (6). 66807pp. doi:10.1063/1.4891403

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Reference TypeJournal (article/letter/editorial)
TitleCharacterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope
JournalJournal of Applied Physics
AuthorsEvans, J.Author
Chapman, S.Author
Year2014 (August 14)Volume116
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.4891403Search in ResearchGate
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Mindat Ref. ID5200150Long-form Identifiermindat:1:5:5200150:7
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Full ReferenceEvans, J., Chapman, S. (2014) Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope. Journal of Applied Physics, 116 (6). 66807pp. doi:10.1063/1.4891403
Plain TextEvans, J., Chapman, S. (2014) Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope. Journal of Applied Physics, 116 (6). 66807pp. doi:10.1063/1.4891403
In(2014, August) Journal of Applied Physics Vol. 116 (6) AIP Publishing

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