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Leonard, E., Arzel, L., Tomassini, M., Zabierowski, P., Fuertes Marrón, D., Barreau, N. (2014) Cu(In,Ga)Se2 absorber thinning and the homo-interface model: Influence of Mo back contact and 3-stage process on device characteristics. Journal of Applied Physics, 116 (7). 74512pp. doi:10.1063/1.4891478

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Reference TypeJournal (article/letter/editorial)
TitleCu(In,Ga)Se2 absorber thinning and the homo-interface model: Influence of Mo back contact and 3-stage process on device characteristics
JournalJournal of Applied Physics
AuthorsLeonard, E.Author
Arzel, L.Author
Tomassini, M.Author
Zabierowski, P.Author
Fuertes Marrón, D.Author
Barreau, N.Author
Year2014 (August 21)Volume116
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.4891478Search in ResearchGate
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Mindat Ref. ID5200233Long-form Identifiermindat:1:5:5200233:9
GUID0
Full ReferenceLeonard, E., Arzel, L., Tomassini, M., Zabierowski, P., Fuertes Marrón, D., Barreau, N. (2014) Cu(In,Ga)Se2 absorber thinning and the homo-interface model: Influence of Mo back contact and 3-stage process on device characteristics. Journal of Applied Physics, 116 (7). 74512pp. doi:10.1063/1.4891478
Plain TextLeonard, E., Arzel, L., Tomassini, M., Zabierowski, P., Fuertes Marrón, D., Barreau, N. (2014) Cu(In,Ga)Se2 absorber thinning and the homo-interface model: Influence of Mo back contact and 3-stage process on device characteristics. Journal of Applied Physics, 116 (7). 74512pp. doi:10.1063/1.4891478
In(2014, August) Journal of Applied Physics Vol. 116 (7) AIP Publishing

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Harel, S., Jonnard, P., Lepetit, T., Arzel, L., Barreau, N. (2019) Impact of KF-post deposition treatment on Cu(In,Ga)Se2 surface and Cu(In,Ga)Se2/CdS interface sulfurization. Applied Surface Science, 473. 1062-1065 doi:10.1016/j.apsusc.2018.12.062
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