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Kraya, L. Y., Kraya, R. A. (2014) Erratum: “Determination of the electronic structure of ferroelectric surfaces by scanning tunneling microscopy” [J. Appl. Phys. 111, 013708 (2012)]. Journal of Applied Physics, 116 (7). 79904pp. doi:10.1063/1.4892776

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Reference TypeJournal (article/letter/editorial)
TitleErratum: “Determination of the electronic structure of ferroelectric surfaces by scanning tunneling microscopy” [J. Appl. Phys. 111, 013708 (2012)]
JournalJournal of Applied Physics
AuthorsKraya, L. Y.Author
Kraya, R. A.Author
Year2014 (August 21)Volume116
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.4892776Search in ResearchGate
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Mindat Ref. ID5200244Long-form Identifiermindat:1:5:5200244:5
GUID0
Full ReferenceKraya, L. Y., Kraya, R. A. (2014) Erratum: “Determination of the electronic structure of ferroelectric surfaces by scanning tunneling microscopy” [J. Appl. Phys. 111, 013708 (2012)]. Journal of Applied Physics, 116 (7). 79904pp. doi:10.1063/1.4892776
Plain TextKraya, L. Y., Kraya, R. A. (2014) Erratum: “Determination of the electronic structure of ferroelectric surfaces by scanning tunneling microscopy” [J. Appl. Phys. 111, 013708 (2012)]. Journal of Applied Physics, 116 (7). 79904pp. doi:10.1063/1.4892776
In(2014, August) Journal of Applied Physics Vol. 116 (7) AIP Publishing

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Kraya, L. Y., Kraya, R. (2012) Determination of the electronic structure of ferroelectric surfaces by scanning tunneling microscopy. Journal of Applied Physics, 111 (1). 13708pp. doi:10.1063/1.3675160
Kraya, R. A., Kraya, L. Y. (2014) Erratum: “Size dependent polarization reversal at nanoscale metal-ferroelectric interfaces” [J. Appl. Phys. 112, 123708 (2012)]. Journal of Applied Physics, 116 (7). 79903pp. doi:10.1063/1.4892775
Kraya, R. A., Kraya, L. Y. (2014) Erratum: “The role of contact size on the formation of Schottky barriers and ohmic contacts at nanoscale metal-semiconductor interfaces” [J. Appl. Phys. 111(6), 064302 (2012)]. Journal of Applied Physics, 116 (7). 79902pp. doi:10.1063/1.4892774
Kraya, R. A., Kraya, L. Y. (2012) Size dependent polarization reversal at nanoscale metal-ferroelectric interfaces. Journal of Applied Physics, 112 (12). 123708pp. doi:10.1063/1.4769437
Kraya, R. A., Kraya, L. Y. (2012) The role of contact size on the formation of Schottky barriers and ohmic contacts at nanoscale metal-semiconductor interfaces. Journal of Applied Physics, 111 (6). 64302pp. doi:10.1063/1.3693542
Kraya, R. A. (2014) Erratum: “The reproducibility of transport conditions at metal nanoparticle-semiconductor interfaces over a range of loading conditions” [Appl. Phys. Lett. 99(5), 053107 (2011)]. Applied Physics Letters, 105 (10). 109902pp. doi:10.1063/1.4895011
Kawamura, Tsutomu, Kojima, Shiro, Kanzawa, Tomohide (1998) Erratum: “Reconstructed (881) Si surface structure observed by scanning tunneling microscopy” [J. Appl. Phys. 82, 6031 (1997)]. Journal of Applied Physics, 84 (1). 660 doi:10.1063/1.368070
Bolotov, Leonid, Uchida, Noriyuki, Kanayama, Toshihiko (2004) Erratum: Scanning-tunneling-microscope-assisted assembling of hydrogen-saturated silicon clusters on Si(111)‐(7×7) surfaces [Appl. Phys. Lett. 78, 3720 (2001)]. Applied Physics Letters, 85 (23). 5791 doi:10.1063/1.1835559
Dang, D. Y., Fan, J. L., Gong, H. R. (2015) ERRATUM: “Thermodynamic and mechanical properties of TiC from ab initio calculation” [J. Appl. Phys. 116, 033509 (2014)]. Journal of Applied Physics, 117 (6). 69901pp. doi:10.1063/1.4908033
Kasu, Makoto, Kobayashi, Naoki (1996) Erratum: ‘‘Surface‐diffusion and step‐bunching mechanisms of metalorganic vapor‐phase epitaxy studied by high‐vacuum scanning tunneling microscopy’’ [J. Appl. Phys. 78, 3026 (1995)]. Journal of Applied Physics, 79 (3). 1822-1823 doi:10.1063/1.362716
Kajikawa, Y. (2014) Erratum: “Effects of impurity-band conduction on thermoelectric properties of lightly doped p-type CoSb3” [J. Appl. Phys. 116, 153710 (2014)]. Journal of Applied Physics, 116 (18). 189901pp. doi:10.1063/1.4901827
 
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