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Aref, T., Averin, A., van Dijken, S., Ferring, A., Koberidze, M., Maisi, V. F., Nguyend, H. Q., Nieminen, R. M., Pekola, J. P., Yao, L. D. (2014) Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging. Journal of Applied Physics, 116 (7). 73702pp. doi:10.1063/1.4893473

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging
JournalJournal of Applied Physics
AuthorsAref, T.Author
Averin, A.Author
van Dijken, S.Author
Ferring, A.Author
Koberidze, M.Author
Maisi, V. F.Author
Nguyend, H. Q.Author
Nieminen, R. M.Author
Pekola, J. P.Author
Yao, L. D.Author
Year2014 (August 21)Volume116
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.4893473Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5200278Long-form Identifiermindat:1:5:5200278:2
GUID0
Full ReferenceAref, T., Averin, A., van Dijken, S., Ferring, A., Koberidze, M., Maisi, V. F., Nguyend, H. Q., Nieminen, R. M., Pekola, J. P., Yao, L. D. (2014) Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging. Journal of Applied Physics, 116 (7). 73702pp. doi:10.1063/1.4893473
Plain TextAref, T., Averin, A., van Dijken, S., Ferring, A., Koberidze, M., Maisi, V. F., Nguyend, H. Q., Nieminen, R. M., Pekola, J. P., Yao, L. D. (2014) Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging. Journal of Applied Physics, 116 (7). 73702pp. doi:10.1063/1.4893473
In(2014, August) Journal of Applied Physics Vol. 116 (7) AIP Publishing

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