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Takahashi, R., Cho, Y., Lippmaa, M. (2015) Interfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate. Journal of Applied Physics, 117 (1). 14104pp. doi:10.1063/1.4905384

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Reference TypeJournal (article/letter/editorial)
TitleInterfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate
JournalJournal of Applied Physics
AuthorsTakahashi, R.Author
Cho, Y.Author
Lippmaa, M.Author
Year2015 (January 7)Volume117
Issue1
PublisherAIP Publishing
DOIdoi:10.1063/1.4905384Search in ResearchGate
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Mindat Ref. ID5200505Long-form Identifiermindat:1:5:5200505:3
GUID0
Full ReferenceTakahashi, R., Cho, Y., Lippmaa, M. (2015) Interfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate. Journal of Applied Physics, 117 (1). 14104pp. doi:10.1063/1.4905384
Plain TextTakahashi, R., Cho, Y., Lippmaa, M. (2015) Interfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate. Journal of Applied Physics, 117 (1). 14104pp. doi:10.1063/1.4905384
In(2015, January) Journal of Applied Physics Vol. 117 (1) AIP Publishing

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Takahashi, R., Tybell, T., Lippmaa, M. (2012) Sub-bandgap photocurrent effects on dynamic pyroelectric measurement in Pt/PbTiO3/Nb:SrTiO3 heterostructures. Journal of Applied Physics, 112 (1). 14111pp. doi:10.1063/1.4736262
Sinnamon, L. J., McAneney, J., Bowman, R. M., Gregg, J. M. (2003) Dependence of the interfacial capacitance on measurement regime used for investigation of thin film ferroelectric capacitors. Journal of Applied Physics, 93 (1). 736-744 doi:10.1063/1.1522476
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Furukawa, T., Kanai, S., Okada, A., Takahashi, Y., Yamamoto, R. (2009) Ferroelectric switching dynamics in VDF-TrFE copolymer thin films spin coated on Si substrate. Journal of Applied Physics, 105 (6). 61636pp. doi:10.1063/1.3055411
Chen, Y. F., Ziese, M., Esquinazi, P. (2007) Interface capacitance of La0.8Ca0.2MnO3∕Nb:SrTiO3 junctions. Journal of Applied Physics, 101 (12). 123906pp. doi:10.1063/1.2748713
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Hu, S. Y., Li, Y. L., Chen, L. Q. (2003) Effect of interfacial dislocations on ferroelectric phase stability and domain morphology in a thin film—a phase-field model. Journal of Applied Physics, 94 (4). 2542-2547 doi:10.1063/1.1590416
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Goren, D., Nemirovsky, Y. (1995) Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements. Journal of Applied Physics, 77 (1). 244-251 doi:10.1063/1.359384
 
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