Reference Type | Journal (article/letter/editorial) |
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Title | Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films |
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Journal | Journal of Applied Physics |
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Authors | Shen, Xuan | Author |
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Qiu, Xiangbiao | Author |
Su, Dong | Author |
Zhou, Shengqiang | Author |
Li, Aidong | Author |
Wu, Di | Author |
Year | 2015 (January 7) | Volume | 117 |
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Issue | 1 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.4905485Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5200519 | Long-form Identifier | mindat:1:5:5200519:6 |
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GUID | 0 |
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Full Reference | Shen, Xuan, Qiu, Xiangbiao, Su, Dong, Zhou, Shengqiang, Li, Aidong, Wu, Di (2015) Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films. Journal of Applied Physics, 117 (1). 15307pp. doi:10.1063/1.4905485 |
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Plain Text | Shen, Xuan, Qiu, Xiangbiao, Su, Dong, Zhou, Shengqiang, Li, Aidong, Wu, Di (2015) Thickness-dependent metal-insulator transition in epitaxial SrRuO3 ultrathin films. Journal of Applied Physics, 117 (1). 15307pp. doi:10.1063/1.4905485 |
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In | (2015, January) Journal of Applied Physics Vol. 117 (1) AIP Publishing |
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