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Oliveira, F., Fischer, I. A., Benedetti, A., Cerqueira, M. F., Vasilevskiy, M. I., Stefanov, S., Chiussi, S., Schulze, J. (2015) Multi-stacks of epitaxial GeSn self-assembled dots in Si: Structural analysis. Journal of Applied Physics, 117 (12). 125706pp. doi:10.1063/1.4915939

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Reference TypeJournal (article/letter/editorial)
TitleMulti-stacks of epitaxial GeSn self-assembled dots in Si: Structural analysis
JournalJournal of Applied Physics
AuthorsOliveira, F.Author
Fischer, I. A.Author
Benedetti, A.Author
Cerqueira, M. F.Author
Vasilevskiy, M. I.Author
Stefanov, S.Author
Chiussi, S.Author
Schulze, J.Author
Year2015 (March 28)Volume117
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.4915939Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5200704Long-form Identifiermindat:1:5:5200704:2
GUID0
Full ReferenceOliveira, F., Fischer, I. A., Benedetti, A., Cerqueira, M. F., Vasilevskiy, M. I., Stefanov, S., Chiussi, S., Schulze, J. (2015) Multi-stacks of epitaxial GeSn self-assembled dots in Si: Structural analysis. Journal of Applied Physics, 117 (12). 125706pp. doi:10.1063/1.4915939
Plain TextOliveira, F., Fischer, I. A., Benedetti, A., Cerqueira, M. F., Vasilevskiy, M. I., Stefanov, S., Chiussi, S., Schulze, J. (2015) Multi-stacks of epitaxial GeSn self-assembled dots in Si: Structural analysis. Journal of Applied Physics, 117 (12). 125706pp. doi:10.1063/1.4915939
In(2015, March) Journal of Applied Physics Vol. 117 (12) AIP Publishing

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