Mehonic, Adnan, Buckwell, Mark, Montesi, Luca, Garnett, Leon, Hudziak, Stephen, Fearn, Sarah, Chater, Richard, McPhail, David, Kenyon, Anthony J. (2015) Structural changes and conductance thresholds in metal-free intrinsic SiOx resistive random access memory. Journal of Applied Physics, 117 (12). 124505pp. doi:10.1063/1.4916259
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Structural changes and conductance thresholds in metal-free intrinsic SiOx resistive random access memory | ||
| Journal | Journal of Applied Physics | ||
| Authors | Mehonic, Adnan | Author | |
| Buckwell, Mark | Author | ||
| Montesi, Luca | Author | ||
| Garnett, Leon | Author | ||
| Hudziak, Stephen | Author | ||
| Fearn, Sarah | Author | ||
| Chater, Richard | Author | ||
| McPhail, David | Author | ||
| Kenyon, Anthony J. | Author | ||
| Year | 2015 (March 28) | Volume | 117 |
| Issue | 12 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4916259Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5200731 | Long-form Identifier | mindat:1:5:5200731:6 |
| GUID | 0 | ||
| Full Reference | Mehonic, Adnan, Buckwell, Mark, Montesi, Luca, Garnett, Leon, Hudziak, Stephen, Fearn, Sarah, Chater, Richard, McPhail, David, Kenyon, Anthony J. (2015) Structural changes and conductance thresholds in metal-free intrinsic SiOx resistive random access memory. Journal of Applied Physics, 117 (12). 124505pp. doi:10.1063/1.4916259 | ||
| Plain Text | Mehonic, Adnan, Buckwell, Mark, Montesi, Luca, Garnett, Leon, Hudziak, Stephen, Fearn, Sarah, Chater, Richard, McPhail, David, Kenyon, Anthony J. (2015) Structural changes and conductance thresholds in metal-free intrinsic SiOx resistive random access memory. Journal of Applied Physics, 117 (12). 124505pp. doi:10.1063/1.4916259 | ||
| In | (2015, March) Journal of Applied Physics Vol. 117 (12) AIP Publishing | ||
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