Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Kumar, A. K. Nanda, Prasanna, S., Subramanian, B., Jayakumar, S., Rao, G. Mohan (2015) A transmission electron microscopy and X-ray photoelectron spectroscopy study of annealing induced γ-phase nucleation, clustering, and interfacial dynamics in reactively sputtered amorphous alumina thin films. Journal of Applied Physics, 117 (12). 125307pp. doi:10.1063/1.4916331

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleA transmission electron microscopy and X-ray photoelectron spectroscopy study of annealing induced γ-phase nucleation, clustering, and interfacial dynamics in reactively sputtered amorphous alumina thin films
JournalJournal of Applied Physics
AuthorsKumar, A. K. NandaAuthor
Prasanna, S.Author
Subramanian, B.Author
Jayakumar, S.Author
Rao, G. MohanAuthor
Year2015 (March 28)Volume117
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.4916331Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5200732Long-form Identifiermindat:1:5:5200732:5
GUID0
Full ReferenceKumar, A. K. Nanda, Prasanna, S., Subramanian, B., Jayakumar, S., Rao, G. Mohan (2015) A transmission electron microscopy and X-ray photoelectron spectroscopy study of annealing induced γ-phase nucleation, clustering, and interfacial dynamics in reactively sputtered amorphous alumina thin films. Journal of Applied Physics, 117 (12). 125307pp. doi:10.1063/1.4916331
Plain TextKumar, A. K. Nanda, Prasanna, S., Subramanian, B., Jayakumar, S., Rao, G. Mohan (2015) A transmission electron microscopy and X-ray photoelectron spectroscopy study of annealing induced γ-phase nucleation, clustering, and interfacial dynamics in reactively sputtered amorphous alumina thin films. Journal of Applied Physics, 117 (12). 125307pp. doi:10.1063/1.4916331
In(2015, March) Journal of Applied Physics Vol. 117 (12) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Prasanna, S., Kumar, A. K. Nanda, Rao, G. Mohan, Jayakumar, S., Balasundaraprabhu, R. (2014) Effect of Post-Deposition Annealing on the Al2O3/Si(100) Interface Properties. Science of Advanced Materials, 6. 1032-1036 doi:10.1166/sam.2014.1863
Kumar, A. K. Nanda, Jayakumar, S., Kannan, M. D., Rajagopalan, S., Balamurugan, A. K., Tyagi, A. K., Kumar, Sanjeev, Reddy, G. L. N., Ramana, J. V., Raju, V. S. (2009) Surface and interface reactions of sputtered TiNi/Si thin films. Journal of Applied Physics, 105 (6). 63517pp. doi:10.1063/1.3082126
Vijayakumar, Arun, Todi, R. M., Sundaram, K. B. (2007) Oxygen Annealing Characterization of Reactively Sputtered SiCBN Thin Films by X-Ray Photoelectron Spectroscopy. Journal of the Electrochemical Society, 154. doi:10.1149/1.2732166
Kalyva, M., Siokou, A., Yannopoulos, S. N., Wagner, T., Krbal, , Orava, J., Frumar, M. (2008) Soft x-ray induced Ag diffusion in amorphous pulse laser deposited As50Se50 thin films: An x-ray photoelectron and secondary ion mass spectroscopy study. Journal of Applied Physics, 104 (4). 43704pp. doi:10.1063/1.2970104
Karpenko, O. P., Bilello, J. C., Yalisove, S. M. (1994) Combined transmission electron microscopy and x‐ray study of the microstructure and texture in sputtered Mo films. Journal of Applied Physics, 76 (8). 4610-4617 doi:10.1063/1.357295
Bortz, Michael, Ohuchi, Fumio S. (1988) An x‐ray photoelectron spectroscopy study of the interfacial relations between titanium and cordierite‐based ceramic thin films. Journal of Applied Physics, 64 (4). 2054-2058 doi:10.1063/1.341712
Pinnow, C. U., Bicker, M., Geyer, U., Schneider, S., Goerigk, G. (2001) Decomposition and nanocrystallization in reactively sputtered amorphous Ta–Si–N thin films. Journal of Applied Physics, 90 (4). 1986-1991 doi:10.1063/1.1388173
Kumar, Ajay, Malhotra, L. K., Chopra, K. L. (1989) Infrared and x‐ray photoelectron spectroscopic study of photostructural changes in amorphous P‐Ge‐Se thin films. Journal of Applied Physics, 65 (4). 1671-1675 doi:10.1063/1.342937
Kumar, S. Sathish, Sharma, Amit, Rao, G. Mohan, Suwas, Satyam (2017) Investigations on the effect of substrate temperature on the properties of reactively sputtered zirconium carbide thin films. Journal of Alloys and Compounds, 695. 1020-1028 doi:10.1016/j.jallcom.2016.10.225
Yumoto, S., Ohshima, N. (1994) A study of the structural properties of sputtered CoCrPt based on x‐ray diffraction, small angle x‐ray scattering, XAFS, and transmission electron microscopy measurements (abstract). Journal of Applied Physics, 75 (10). 6160 doi:10.1063/1.355442
Zembutsu, S. (1981) X‐ray photoelectron spectroscopy studies of Ag photodoping in Se‐Ge amorphous films. Applied Physics Letters, 39 (12). 969-971 doi:10.1063/1.92629
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 22, 2025 20:54:28
Go to top of page