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Przybylski, M., Żukrowski, J., Harward, I., Celiński, Z. (2015) Mössbauer spectroscopy study of Al distribution in BaAlxFe12−xO19 thin films. Journal of Applied Physics, 117 (17). 17pp. doi:10.1063/1.4914359

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Reference TypeJournal (article/letter/editorial)
TitleMössbauer spectroscopy study of Al distribution in BaAlxFe12−xO19 thin films
JournalJournal of Applied Physics
AuthorsPrzybylski, M.Author
Żukrowski, J.Author
Harward, I.Author
Celiński, Z.Author
Year2015 (May 7)Volume117
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.4914359Search in ResearchGate
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Mindat Ref. ID5201220Long-form Identifiermindat:1:5:5201220:2
GUID0
Full ReferencePrzybylski, M., Żukrowski, J., Harward, I., Celiński, Z. (2015) Mössbauer spectroscopy study of Al distribution in BaAlxFe12−xO19 thin films. Journal of Applied Physics, 117 (17). 17pp. doi:10.1063/1.4914359
Plain TextPrzybylski, M., Żukrowski, J., Harward, I., Celiński, Z. (2015) Mössbauer spectroscopy study of Al distribution in BaAlxFe12−xO19 thin films. Journal of Applied Physics, 117 (17). 17pp. doi:10.1063/1.4914359
In(2015, May) Journal of Applied Physics Vol. 117 (17) AIP Publishing

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