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Özerinç, Sezer, Kim, Hoe Joon, Averback, Robert S., King, William P. (2015) Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2. Journal of Applied Physics, 117 (2). 24310pp. doi:10.1063/1.4905019

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Reference TypeJournal (article/letter/editorial)
TitleDirect measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2
JournalJournal of Applied Physics
AuthorsÖzerinç, SezerAuthor
Kim, Hoe JoonAuthor
Averback, Robert S.Author
King, William P.Author
Year2015 (January 14)Volume117
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.4905019Search in ResearchGate
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Mindat Ref. ID5201723Long-form Identifiermindat:1:5:5201723:4
GUID0
Full ReferenceÖzerinç, Sezer, Kim, Hoe Joon, Averback, Robert S., King, William P. (2015) Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2. Journal of Applied Physics, 117 (2). 24310pp. doi:10.1063/1.4905019
Plain TextÖzerinç, Sezer, Kim, Hoe Joon, Averback, Robert S., King, William P. (2015) Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2. Journal of Applied Physics, 117 (2). 24310pp. doi:10.1063/1.4905019
In(2015, January) Journal of Applied Physics Vol. 117 (2) AIP Publishing

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Kim, Jin Hyeok, Lee, Jeong Yong (1996) Al-Induced Crystallization of an Amorphous Si Thin Film in a Polycrystalline Al/Native SiO2/Amorphous Si Structure. Japanese Journal of Applied Physics, 35. 2052-2056 doi:10.1143/jjap.35.2052
Tai, Kaiping, Averback, Robert S., Bellon, Pascal, Ashkenazy, Yinon, Stumphy, Brad (2012) Temperature dependence of irradiation-induced creep in dilute nanostructured Cu–W alloys. Journal of Nuclear Materials, 422 (1). 8-13 doi:10.1016/j.jnucmat.2011.11.068
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