Wu, Y., Peroulis, D. (2015) Contact behavior evolution induced by damage growth in radio-frequency microelectromechanical system switches. Journal of Applied Physics, 117 (6). 64505pp. doi:10.1063/1.4907803
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Contact behavior evolution induced by damage growth in radio-frequency microelectromechanical system switches | ||
Journal | Journal of Applied Physics | ||
Authors | Wu, Y. | Author | |
Peroulis, D. | Author | ||
Year | 2015 (February 14) | Volume | 117 |
Issue | 6 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.4907803Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5202318 | Long-form Identifier | mindat:1:5:5202318:3 |
GUID | 0 | ||
Full Reference | Wu, Y., Peroulis, D. (2015) Contact behavior evolution induced by damage growth in radio-frequency microelectromechanical system switches. Journal of Applied Physics, 117 (6). 64505pp. doi:10.1063/1.4907803 | ||
Plain Text | Wu, Y., Peroulis, D. (2015) Contact behavior evolution induced by damage growth in radio-frequency microelectromechanical system switches. Journal of Applied Physics, 117 (6). 64505pp. doi:10.1063/1.4907803 | ||
In | (2015, February) Journal of Applied Physics Vol. 117 (6) AIP Publishing |
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