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D'Alfonso, A. J., Allen, L. J., Sawada, H., Kirkland, A. I. (2016) Dose-dependent high-resolution electron ptychography. Journal of Applied Physics, 119 (5). 54302pp. doi:10.1063/1.4941269

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Reference TypeJournal (article/letter/editorial)
TitleDose-dependent high-resolution electron ptychography
JournalJournal of Applied Physics
AuthorsD'Alfonso, A. J.Author
Allen, L. J.Author
Sawada, H.Author
Kirkland, A. I.Author
Year2016 (February 7)Volume119
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.4941269Search in ResearchGate
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Mindat Ref. ID5204844Long-form Identifiermindat:1:5:5204844:7
GUID0
Full ReferenceD'Alfonso, A. J., Allen, L. J., Sawada, H., Kirkland, A. I. (2016) Dose-dependent high-resolution electron ptychography. Journal of Applied Physics, 119 (5). 54302pp. doi:10.1063/1.4941269
Plain TextD'Alfonso, A. J., Allen, L. J., Sawada, H., Kirkland, A. I. (2016) Dose-dependent high-resolution electron ptychography. Journal of Applied Physics, 119 (5). 54302pp. doi:10.1063/1.4941269
In(2016, February) Journal of Applied Physics Vol. 119 (5) AIP Publishing

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D'Alfonso, A. J., Morgan, A. J., Yan, A. W. C., Wang, P., Sawada, H., Kirkland, A. I., Allen, L. J. (2014) Deterministic electron ptychography at atomic resolution. Physical Review B, 89 (6) doi:10.1103/physrevb.89.064101
Allen, C. S., Danaie, M., Warner, J. H., Batey, D. J., Kirkland, A. I. (2023) Super-resolution electron ptychography of low dimensional materials at 30 keV: Beyond the detector limit. Applied Physics Letters, 123 (2) doi:10.1063/5.0143684
Song, Jiamei, Allen, Christopher S., Gao, Si, Huang, Chen, Sawada, Hidetaka, Pan, Xiaoqing, Warner, Jamie, Wang, Peng, Kirkland, Angus I. (2019) Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector. Scientific Reports, 9. doi:10.1038/s41598-019-40413-z
Song, Jiamei, Song, Biying, Zou, Liqi, Allen, Christopher, Sawada, Hidetaka, Zhang, Fucai, Pan, Xiaoqing, Kirkland, Angus. I., Wang, Peng (2018) Fast and Low-dose Electron Ptychography. Microscopy and Microanalysis, 24. 224-225 doi:10.1017/s1431927618001617
Brown, H. G., D'Alfonso, A. J., Allen, L. J. (2013) Secondary electron imaging at atomic resolution using a focused coherent electron probe. Physical Review B, 87 (5) doi:10.1103/physrevb.87.054102
Morgan, A. J., D’Alfonso, A. J., Wang, P., Sawada, H., Kirkland, A. I., Allen, L. J. (2013) Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution. Physical Review B, 87 (9) doi:10.1103/physrevb.87.094115
D'Alfonso, A J, Cosgriff, E C, Findlay, S D, Kirkland, A I, Nellist, P D, Oxley, M P, Allen, L J (2008) Depth sectioning using electron energy loss spectroscopy. Journal of Physics: Conference Series, 126. 12037pp. doi:10.1088/1742-6596/126/1/012037
Allen, Christopher S., Song, Jiamei, Danaie, Mohsen, Wang, Peng, Kirkland, Angus I. (2018) Low Dose Defocused Probe Electron Ptychography Using a Fast Direct Electron Detector. Microscopy and Microanalysis, 24. 186-187 doi:10.1017/s1431927618001423
Cosgriff, E C, D'Alfonso, A J, Allen, L J, Findlay, S D, Kirkland, A I, Nellist, P D (2008) Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy. Journal of Physics: Conference Series, 126. 12036pp. doi:10.1088/1742-6596/126/1/012036
Allen, Christopher S., Kirkland, Angus I. (2016) Response to “Comment on ‘Temperature dependence of atomic vibrations in mono-layer graphene’” [J. Appl. Phys. 119, 066101 (2016)]. Journal of Applied Physics, 119 (6). 66102pp. doi:10.1063/1.4941386
Song, Biying, Ding, Zhiyuan, Allen, Christopher, Sawada, Hidetaka, Pan, Xiaoqing, Kirkland, Angus I., Wang, Peng (2019) Electron ptychography using an ultrafast direct electron detector. Microscopy and Microanalysis, 25. 20-21 doi:10.1017/s1431927619000837
 
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