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Eliseev, Eugene A., Morozovsky, Nicholas V., Yelisieiev, Mykola Ye., Morozovska, Anna N. (2016) Extrinsic size effect of pyroelectric response of ferroelectric films. Journal of Applied Physics, 120 (17). 174102pp. doi:10.1063/1.4966611

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Reference TypeJournal (article/letter/editorial)
TitleExtrinsic size effect of pyroelectric response of ferroelectric films
JournalJournal of Applied Physics
AuthorsEliseev, Eugene A.Author
Morozovsky, Nicholas V.Author
Yelisieiev, Mykola Ye.Author
Morozovska, Anna N.Author
Year2016 (November 7)Volume120
Issue17
PublisherAIP Publishing
DOIdoi:10.1063/1.4966611Search in ResearchGate
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Mindat Ref. ID5205536Long-form Identifiermindat:1:5:5205536:8
GUID0
Full ReferenceEliseev, Eugene A., Morozovsky, Nicholas V., Yelisieiev, Mykola Ye., Morozovska, Anna N. (2016) Extrinsic size effect of pyroelectric response of ferroelectric films. Journal of Applied Physics, 120 (17). 174102pp. doi:10.1063/1.4966611
Plain TextEliseev, Eugene A., Morozovsky, Nicholas V., Yelisieiev, Mykola Ye., Morozovska, Anna N. (2016) Extrinsic size effect of pyroelectric response of ferroelectric films. Journal of Applied Physics, 120 (17). 174102pp. doi:10.1063/1.4966611
In(2016, November) Journal of Applied Physics Vol. 120 (17) AIP Publishing

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Morozovska, Anna N., Eliseev, Eugene A., Morozovsky, Nicholas V., Kalinin, Sergei V. (2017) Ferroionic states in ferroelectric thin films. Physical Review B, 95 (19) doi:10.1103/physrevb.95.195413
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Morozovska, A. N., Eliseev, E. A., Svechnikov, G. S., Kalinin, S. V. (2010) Pyroelectric response of ferroelectric nanowires: Size effect and electric energy harvesting. Journal of Applied Physics, 108 (4). 42009pp. doi:10.1063/1.3474964
Eliseev, Eugene A., Kalinin, Sergei V., Morozovska, Anna N. (2015) Finite size effects in ferroelectric-semiconductor thin films under open-circuit electric boundary conditions. Journal of Applied Physics, 117 (3). 34102pp. doi:10.1063/1.4906139
Morozovska, Anna N., Svechnikov, Sergei V., Eliseev, Eugene A., Kalinin, Sergei V. (2007) Extrinsic size effect in piezoresponse force microscopy of thin films. Physical Review B, 76 (5) doi:10.1103/physrevb.76.054123
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