Reference Type | Journal (article/letter/editorial) |
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Title | Phonon-boundary scattering in nanoporous silicon films: Comparison of Monte Carlo techniques |
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Journal | Journal of Applied Physics |
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Authors | Parrish, Kevin D. | Author |
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Abel, Justin R. | Author |
Jain, Ankit | Author |
Malen, Jonathan A. | Author |
McGaughey, Alan J. H. | Author |
Year | 2017 (September 28) | Volume | 122 |
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Issue | 12 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.4993601Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5207514 | Long-form Identifier | mindat:1:5:5207514:0 |
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GUID | 0 |
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Full Reference | Parrish, Kevin D., Abel, Justin R., Jain, Ankit, Malen, Jonathan A., McGaughey, Alan J. H. (2017) Phonon-boundary scattering in nanoporous silicon films: Comparison of Monte Carlo techniques. Journal of Applied Physics, 122 (12). 125101pp. doi:10.1063/1.4993601 |
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Plain Text | Parrish, Kevin D., Abel, Justin R., Jain, Ankit, Malen, Jonathan A., McGaughey, Alan J. H. (2017) Phonon-boundary scattering in nanoporous silicon films: Comparison of Monte Carlo techniques. Journal of Applied Physics, 122 (12). 125101pp. doi:10.1063/1.4993601 |
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In | (2017, September) Journal of Applied Physics Vol. 122 (12) AIP Publishing |
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